Theoretical analysis of the threshold current density in GaN/AlGaN strained quantum well lasers with a modulation-doped structure

被引:5
|
作者
Niwa, A
Ohtoshi, T
Kuroda, T
机构
来源
关键词
semiconductor lasers; III-V nitrides; modulation-doped structure; quantum well; tight-binding method; threshold current density;
D O I
10.1143/JJAP.36.L771
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dependence of the threshold current density on the doping type and dopant concentration in GaN/AlGaN modulation-doped (MD) strained quantum well (QW) lasers is theoretically investigated. This investigation is based on a detailed band structure calculation using the tight-binding method. It is found that the threshold current density of GaN/AlGaN n-type MD-QW lasers can be reduced to 1/2-1/3 that of undoped lasers due to the reduced transparent injected carrier density. The threshold current in p-type MD lasers, however, increases because of decreased carrier lifetime. These results show that n-type MD-QW lasers are more suitable for short-wavelength lasers based on III-V nitrides.
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页码:L771 / L773
页数:3
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