Resolution effect on the study of ductile damage using synchrotron X-ray tomography

被引：30

作者：

Landron, C. ^{[1
]}

Maire, E. ^{[1
]}

Adrien, J. ^{[1
]}

Bouaziz, O. ^{[2
]}

Di Michiel, M. ^{[3
]}

Cloetens, P. ^{[3
]}

Suhonen, H. ^{[3
]}

机构：

[1] Inst Natl Sci Appl, CNftS, MATEIS, UMR5510, F-69621 Villeurbanne, France

[2] ArcelorMittal Res, F-57283 Maizieres Les Metz, France

[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2012年 / 284卷

关键词：

X-ray tomography; Ductile damage; VOID GROWTH; FRACTURE; MODEL; DEFORMATION; ALLOY; NUCLEATION; INITIATION;

D O I：

10.1016/j.nimb.2011.08.069

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper, the effect of the resolution on damage characterization in a Dual-Phase steel was investigated. In situ and ex situ tensile tests were carried out on two synchrotron tomographs achieving a voxel size of 1.6 mu m and 100 nm. A higher volume fraction of cavity was first qualitatively observed on three-dimensional views and confirmed by quantitative analysis: a large number of cavities not seen at low resolution is detected with a finer voxel size. On the other hand, void growth characterization seems not to be affected: in this studied case, the low resolution is sufficient. The effect of the underestimation of the number of voids is illustrated with the calculation of the mean distance between cavities, this information being a key parameter of void coalescence. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：15 / 18

页数：4

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