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Approach to synthesis of fault tolerant reduced device count multilevel inverters (FT RDC MLIs)
被引:23
作者:
Dewangan, Niraj Kumar
[1
]
Gupta, Shubhrata
[1
]
Gupta, Krishna Kumar
[2
]
机构:
[1] Natl Inst Technol Raipur, Dept Elect Engn, Raipur, Chhattisgarh, India
[2] Thapar Inst Engn & Technol, Elect & Instrumentat Engn Dept, Patiala, Punjab, India
关键词:
switching convertors;
fault tolerance;
invertors;
power switch;
single switch open-circuit fault;
multilevel inverters;
RDC-MLI;
reduced device count multilevel inverters;
FT RDC MLI;
3-LEVEL INVERTER;
TOPOLOGY;
NUMBER;
DIAGNOSIS;
SCHEME;
D O I:
10.1049/iet-pel.2018.5176
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Multilevel inverters (MLIs) are rapidly acquiring techno-economic feasibility for both high-power and medium-power applications. Increased number of power switches has been cited as one of the most important limitations of MLIs; and to overcome it, a whole new class of MLI topologies has come up. These topologies are commonly called 'reduced device count' MLIs (RDC-MLIs). As the number of controlled switches is significantly reduced in RDC-MLIs, the redundant states are also reduced. Hence, the possibility of fault tolerant operation is severely affected. This study looks at the possibility of imparting fault-tolerant characteristics to RDC-MLIs. In this study, some of the recently proposed RDC-MLI topologies are first analysed for the possibility of fault tolerant operation in the case of 'any single switch open-circuit fault (ASSOF)'. Thereafter, an optimal addition of power switch is proposed which enables fault tolerant operation in the event of ASSOF. Furthermore, these modified RDC-MLIs are verified under normal and faulty conditions using software simulations and experimental set-ups and these results are presented.
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页码:476 / 482
页数:7
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