Review of attosecond resolved measurement and control via carrier-envelope phase tagging with above-threshold ionization

被引:81
作者
Rathje, T. [1 ,2 ]
Johnson, Nora G. [3 ,4 ]
Moeller, M. [1 ]
Suessmann, F. [3 ]
Adolph, D. [1 ]
Kuebel, M. [3 ]
Kienberger, R. [3 ,5 ]
Kling, M. F. [3 ,4 ]
Paulus, G. G. [1 ,2 ,6 ]
Sayler, A. M. [1 ,2 ]
机构
[1] Univ Jena, Inst Opt & Quantenelekt, D-07743 Jena, Germany
[2] Helmholtz Inst Jena, D-07743 Jena, Germany
[3] Max Planck Inst Quantum Opt, D-85748 Garching, Germany
[4] Kansas State Univ, Dept Phys, JR Macdonald Lab, Manhattan, KS 66506 USA
[5] Tech Univ Munich, D-85748 Garching, Germany
[6] Texas A&M Univ, Dept Phys, College Stn, TX 77843 USA
基金
美国国家科学基金会;
关键词
LASER-PULSES; REAL-TIME; ELECTRON LOCALIZATION; SINGLE-SHOT; FIELD; ENERGY;
D O I
10.1088/0953-4075/45/7/074003
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A precise, real-time, single-shot carrier-envelope phase (CEP) tagging technique for few-cycle pulses was developed and combined with cold-target recoil-ion momentum spectroscopy and velocity-map imaging to investigate and control CEP-dependent processes with attosecond resolution. The stability and precision of these new techniques have allowed for the study of intense, few-cycle, laser-matter dynamics with unprecedented detail. Moreover, the same stereo above-threshold ionization (ATI) measurement was expanded to multi-cycle pulses and allows for CEP locking and pulse-length determination. Here we review these techniques and their first applications to waveform characterization and control, non-sequential double ionization of argon, ATI of xenon and electron emission from SiO2 nanospheres.
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页数:14
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