Comparison of thin-film and bulk CuIn1-xGaxSe2 samples by laser induced breakdown spectroscopy

被引：3

作者：

Kim, Chan K. ^{[1
]}

Lee, Seok H. ^{[1
]}

In, Jung H. ^{[1
]}

Shim, Hee-S. ^{[2
]}

Kim, Dong S. ^{[1
]}

Jeong, Sungho ^{[1
]}

机构：

[1] Gwangju Inst Sci & Technol, Sch Mechatron, Kwangju 500712, South Korea

[2] Gwangju Inst Sci & Technol, Res Inst Solar & Sustainable Energies, Kwangju 500712, South Korea

来源：

THIN SOLID FILMS | 2013年 / 546卷

关键词：

CIGS; Thin film; Solar cell; Laser induced breakdown spectroscopy (LIBS); OPTICAL-PROPERTIES; SPECTROMETRY;

D O I：

10.1016/j.tsf.2013.04.068

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The results for laser induced breakdown spectroscopy (LIBS) measurements of CuIn1-xGaxSe2 (CIGS) thin film samples deposited on Mo-coated soda-lime glass by co-evaporation technique and those of bulk form CIGS targets are reported. The LIBS intensity calibration results for the thin film and bulk CIGS samples were compared with respect to the concentration ratios. While the concentrations for thin film CIGS samples were measured by X-ray fluorescence, the compositions of bulk samples were provided by the manufacturer. It was found that the calibration results of Ga/(Ga + In) ratio obtained from the thin film and bulk form samples showed a good agreement at optimized measurement conditions. It is demonstrated that bulk samples can provide reliable reference composition data for the elemental analysis of thin CIGS films. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：393 / 397

页数：5

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