Goodness-of-fit statistics, discrepancies and robust designs

被引：42

作者：

Hickernell, FJ ^{[1
]}

机构：

[1] Hong Kong Baptist Univ, Dept Math, Hong Kong, SAR, Peoples R China

来源：

STATISTICS & PROBABILITY LETTERS | 1999年 / 44卷 / 01期

关键词：

Cramer-Von Mises; low discrepancy; reproducing kernel Hilbert spaces;

D O I：

10.1016/S0167-7152(98)00293-4

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

The Cramer-Von Mises goodness-of-fit statistic, also known as the L-2-star discrepancy, is the optimality criterion for an experimental design for the location model with misspecification. This connection between goodness-of-fit statistics, discrepancies and experimental designs is shown to hold in greater generality. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：73 / 78

页数：6

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