Low-temperature solution-processed alumina as gate dielectric for reducing the operating-voltage of organic field-effect transistors

被引:32
作者
Peng, Jun [1 ]
Sun, Qijun [1 ]
Wang, Suidong [1 ]
Wang, Hai-Qiao [1 ]
Ma, Wanli [1 ]
机构
[1] Soochow Univ, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China
基金
国家高技术研究发展计划(863计划); 中国国家自然科学基金;
关键词
THIN-FILM TRANSISTORS; ATOMIC LAYER DEPOSITION; METAL-OXIDE; SOL-GEL; PERFORMANCE; ELECTRONICS; XPS;
D O I
10.1063/1.4818343
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a facile route for developing solution-processed Al2O3 film at low temperature (<180 degrees C) and its application in organic field-effect transistors (OFETs). Compared to OFETs using conventional SiO2 gate dielectric, the pentacene-based OFETs using Al2O3 thin film gate dielectric achieved comparable on-off drain current ratio (over 10(5)), five times high field-effect mobility (similar to 2.7 cm(2)/Vs), threshold voltage of similar to-1.4V and a greatly reduced operating voltage. The achieved low voltage operation can significantly reduce power consumption of OFETs. Furthermore, the low-temperature processing of the solution-processed Al2O3 film paves the way for fabricating organic electronic devices on flexible plastic substrates. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:4
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