Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

被引：24
|
作者：
Yasuda, N [1 ]
Yamamoto, M
Amemiya, K
Takahashi, H
Kyan, A
Ogura, K
机构：
[1] Natl Inst Radiol Sci, Chiba 2638555, Japan
[2] Univ Tokyo, Tokyo 1130033, Japan
[3] Ibaraki Univ, Grad Sch Sci & Engn, Mito, Ibaraki 3100056, Japan
[4] Nihon Univ, Coll Ind Technol, Narashino, Chiba 2750006, Japan
来源：
RADIATION MEASUREMENTS | 1999年 / 31卷 / 1-6期
关键词：
CR-39; Atomic Force Microscope (AFM); roughness; track sensitivity;
D O I：
10.1016/S1350-4487(99)00089-X
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
Atomic Force Microscope (AFM) has been applied to evaluate the surface roughness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the roughness of the detector surface after etching. The surface of CR-39 (CR-39 doped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1)) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even for the long etching.
引用
收藏
页码：203 / 208
页数：6
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