Influence of optical fiber coatings on the long-term accuracy of interferometric fiber-optic current sensors

被引:2
作者
Lenner, Miklos [1 ]
Yang, Lin [1 ]
Frank, Andreas [1 ]
Bohnert, Klaus [1 ]
机构
[1] ABB Switzerland Ltd, Corp Res Ctr, CH-5405 Baden, Switzerland
来源
PROCEEDINGS OF THE 30TH ANNIVERSARY EUROSENSORS CONFERENCE - EUROSENSORS 2016 | 2016年 / 168卷
关键词
Fiber optic sensors; Faraday effect; reliability; accelerated testing; interferometry; polarimetry;
D O I
10.1016/j.proeng.2016.11.502
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We conducted accelerated ageing tests of different types of acrylate-coated elliptical-core polarization maintaining fibers that are used in fiber-optic current sensors. In particular, we determined how exposure to elevated temperatures affects the polarization extinction ratio of the fibers and, as a consequence, the sensor scale factor. The results show that the proper choice of the fiber coating is imperative for maintaining the sensor's long-term accuracy and reliability. (C) 2016 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license.
引用
收藏
页码:1735 / 1738
页数:4
相关论文
共 7 条
  • [1] Temperature and vibration insensitive fiber-optic current sensor
    Bohnert, K
    Gabus, P
    Nehring, J
    Brändle, H
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2002, 20 (02) : 267 - 276
  • [2] Fiber-optic current sensor for electrowinning of metals
    Bohnert, Klaus
    Gabus, Philippe
    Nehring, Jurgen
    Brandle, Hubert
    Brunzel, Martin Georg
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2007, 25 (11) : 3602 - 3609
  • [3] Budy S. M., 2009, Journal of Lightwave Technology, V27, P5626, DOI 10.1109/JLT.2009.2032368
  • [4] THERMALLY INDUCED STRESSES IN AN OPTICAL-FIBER COATING
    KING, WW
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 1991, 9 (08) : 952 - 953
  • [5] Lefevre H., 1993, FIBER OPTIC GYROSCOP
  • [6] Lenner M., 2014, TOP M OPT SENS SENS, P28
  • [7] Thermal Stability of Specialty Optical Fibers
    Stolov, Andrei A.
    Simoff, Debra A.
    Li, Jie
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2008, 26 (17-20) : 3443 - 3451