Enabling a Reliable STT-MRAM Main Memory Simulation

被引:14
|
作者
Asifuzzaman, Kazi [1 ,2 ]
Sanchez Verdejo, Rommel [1 ,2 ]
Radojkovic, Petar [1 ]
机构
[1] Barcelona Supercomp Ctr, Barcelona, Spain
[2] Univ Politecn Cataluna, Barcelona, Spain
基金
欧盟地平线“2020”;
关键词
STT-MRAM; Main memory; High-performance computing;
D O I
10.1145/3132402.3132416
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
STT-MRAM is a promising new memory technology with very desirable set of properties such as non-volatility, byte-addressability and high endurance. It has the potential to become the universal memory that could be incorporated to all levels of memory hierarchy. Although STT-MRAM technology got significant attention of various major memory manufacturers, to this day, academic research of STT-MRAM main memory remains marginal. This is mainly due to the unavailability of publicly available detailed timing parameters which are required to perform a cycle accurate main memory simulation. Our study presents a detailed analysis of STT-MRAM main memory timing and propose an approach to perform a reliable system level simulation of the memory technology. We seamlessly incorporate STT-MRAM timing parameters into DRAMSim2 memory simulator and use it as a part of the simulation infrastructure of the high-performance computing (HPC) systems. Our results suggests that, STT-MRAM main memory would provide performance comparable to DRAM, while opening up various opportunities for HPC system improvements. Most importantly, our study enables researchers to conduct reliable system level research on STT-MRAM main memory, and to explore the opportunities that this technology has to offer.
引用
收藏
页码:283 / 292
页数:10
相关论文
共 50 条
  • [31] Optimal Design of DDR3 STT-MRAM Memory
    Li, Yueting
    Wang, Gefei
    Cao, Kaihua
    Leng, Qunwen
    Zhao, Weisheng
    2021 5TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE (EDTM), 2021,
  • [32] Micro magnetic Simulation of Write Error Probability in STT-MRAM
    Kawabata, K.
    Tanizawa, M.
    Ishikawa, K.
    Inoue, Y.
    SISPAD: 2008 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2008, : 53 - 56
  • [33] Simulation of SAF-Enhanced Multilayered STT-MRAM Structures
    Bendra, Mario
    Goes, Wolfgang
    Selberherr, Siegfried
    Sverdlov, Viktor
    2024 AUSTROCHIP WORKSHOP ON MICROELECTRONICS, AUSTROCHIP 2024, 2024,
  • [34] STT-MRAM that works at high temperatures
    Zeissler, Katharina
    NATURE ELECTRONICS, 2023, 6 (03) : 180 - 180
  • [35] STT-MRAM that works at high temperatures
    Katharina Zeissler
    Nature Electronics, 2023, 6 : 180 - 180
  • [36] Modeling thermal effects in STT-MRAM
    Hadamek, Tomas
    Selberherr, Siegfried
    Goes, Wolfgang
    Sverdlov, Viktor
    SOLID-STATE ELECTRONICS, 2023, 200
  • [37] Hard Error Correction in STT-MRAM
    Hemaram, Surendra
    Tahoori, Mehdi B.
    Catthoor, Francky
    Rao, Siddharth
    Couet, Sebastien
    Kar, Gouri Sankar
    29TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2024, 2024, : 752 - 757
  • [38] Electrical Modeling of STT-MRAM Defects
    Wu, Lizhou
    Taouil, Mottaqiallah
    Rao, Siddharth
    Marinissen, Erik Jan
    Hamdioui, Said
    2018 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2018,
  • [39] Analysis of Dynamic Models of STT-MRAM
    Mathew, Betty Rachel
    Mangai, N. M. Siva
    2018 4TH INTERNATIONAL CONFERENCE ON DEVICES, CIRCUITS AND SYSTEMS (ICDCS), 2018, : 259 - 262
  • [40] Improving Write Performance for STT-MRAM
    Bishnoi, Rajendra
    Ebrahimi, Mojtaba
    Oboril, Fabian
    Tahoori, Mehdi B.
    IEEE TRANSACTIONS ON MAGNETICS, 2016, 52 (08)