Carbon nanotube's modification by focused ion beam irradiation and its healing strategies

被引:9
|
作者
Xu, Zongwei [1 ]
Xu, Lihua [1 ]
Fang, Fengzhou [1 ]
Gao, Haifeng [1 ]
Li, Wanli [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Ctr MicroNano Mfg Technol, Tianjin 300072, Peoples R China
基金
中国国家自然科学基金;
关键词
Carbon nanotube; Focused ion beam; Thermal annealing; Laser annealing; Self-healing;
D O I
10.1016/j.nimb.2012.12.111
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Single-walled carbon nanotube (SWNT) clusters' properties and performance have been studied after irradiated by focused ion beam (FIB) Ga ions and post annealing recovery methods. The SWNT was irradiated by FIB with different energy and different doses ranging from 10(13) to 10(17) ions/cm(2). Raman spectroscopy results showed that FIB with larger energy or larger ion dose would cause distinct SWNT structure defects. It was also found that scanning electron microscope (SEM) observations would slightly affect the SWNT's Raman results by electron beam induced carbon deposition. Resulting from the unique reconstruction ability of carbon nanotube's (CNT's) network structures, the SWNT's ion-induced defects can be effectively healed by the post heat annealing from 300 degrees C to 600 degrees C for the ion dose less than 10(16) ions/cm(2). And laser irradiation annealing method also studied to heal the defects in SWNT with 25 mW laser power. Research results would be beneficial for the optimization of the carbon nanotube devices' functionalizations using FIB Ga ions irradiation. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:203 / 206
页数:4
相关论文
共 50 条
  • [1] Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam
    Han, C. -S.
    Park, J. -K.
    Yoon, Y. -H.
    Shin, Y. -H.
    CARBON, 2006, 44 (15) : 3375 - 3378
  • [2] Improvement of the Carbon Nanotube Tip by Focused Ion Beam and its Performance Evaluation
    Shin, Young-Hyun
    Yoon, Yu-Hwan
    Lee, Eung-Sug
    Han, Chang-Soo
    TRANSACTIONS OF THE KOREAN SOCIETY OF MECHANICAL ENGINEERS A, 2007, 31 (01) : 139 - 144
  • [3] Fabrication technique for carbon nanotube single-electron transistors using focused ion beam
    Kurokawa, Y
    Ohno, Y
    Kishimoto, S
    Okazaki, T
    Shinohara, H
    Mizutani, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (8A): : 5669 - 5670
  • [4] Imaging characterization of carbon nanotube tips modified using a focused ion beam
    Shin, Young-Hyun
    Song, Jin-Won
    Lee, Eung-Sug
    Han, Chang-Soo
    APPLIED SURFACE SCIENCE, 2007, 253 (16) : 6872 - 6877
  • [5] Increased Tensile Strength of Carbon Nanotube Yarns and Sheets through Chemical Modification and Electron Beam Irradiation
    Miller, Sandi G.
    Williams, Tiffany S.
    Baker, James S.
    Sola, Francisco
    Lebion-Colon, Marisabel
    McCorkle, Linda S.
    Wilmoth, Nathan G.
    Gaier, James
    Chen, Michelle
    Meador, Michael A.
    ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (09) : 6120 - 6126
  • [6] Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter
    Chai, GY
    Chow, L
    Zhou, D
    Byahut, SR
    CARBON, 2005, 43 (10) : 2083 - 2087
  • [7] Focused ion beam irradiation - morphological and chemical evolution in PMMA
    Kochumalayil, J. J.
    Meiser, A.
    Soldera, F.
    Possart, W.
    SURFACE AND INTERFACE ANALYSIS, 2009, 41 (05) : 412 - 420
  • [8] Control of tunnel barriers in multi-wall carbon nanotubes using focused ion beam irradiation
    Tomizawa, H.
    Suzuki, K.
    Yamaguchi, T.
    Akita, S.
    Ishibashi, K.
    NANOTECHNOLOGY, 2017, 28 (16)
  • [9] Focused ion beam patterning of diamondlike carbon films
    Stanishevsky, A
    DIAMOND AND RELATED MATERIALS, 1999, 8 (07) : 1246 - 1250
  • [10] Simulation of Redeposited Silicon Sputtering under Focused Ion Beam Irradiation
    Rumyantsev A.V.
    Borgardt N.I.
    Volkov R.L.
    Journal of Surface Investigation, 2018, 12 (03): : 607 - 612