Variation- and Degradation-Aware Stochastic Behavioral Modeling of Analog Circuit Components

被引：0

作者：

Taddiken, Maike ^{[1
]}

Hillebrand, Theodor ^{[1
]}

Paul, Steffen ^{[1
]}

Peters-Drolshagen, Dagmar ^{[1
]}

机构：

[1] Univ Bremen, Inst Electrodynam & Microelect ITEM Me, Bremen, Germany

来源：

2017 14TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD) | 2017年

关键词：

VARIABILITY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Process variation and aging effects influence the performances of integrated circuits in modern technology nodes. In this paper, a method is proposed to build a behavioral model to represent the influences of process variation, aging and operational parameters on circuit performances. The variability of performance is represented using distribution functions while Response Surface Models (RSM) are used to describe the dependence of the distribution's moments on operational parameters. Compared to other approaches, less parameters have to be included in the RSM therefore reducing the complexity. This enables a fast Monte-Carlo analysis with aging analysis on a behavioral level. The method is evaluated for a voltage reference circuit and an operational amplifier showing a good representation of the variability and reaching a very good speedup of simulation time.

引用

页数：4

共 10 条

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