Formation of nanocrystalline films of Sr2FeMoO6 on Si(100) by pulsed laser deposition: Observation of preferential oriented growth

被引:11
作者
Jalili, Helia [1 ]
Heinig, Nina F. [2 ]
Leung, K. T. [1 ,2 ]
机构
[1] Univ Waterloo, Dept Phys, Waterloo, ON N2L 3G1, Canada
[2] Univ Waterloo, Dept Chem, Waterloo, ON N2L 3G1, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
coercive force; ferromagnetic materials; grain size; insulating thin films; iron compounds; magnetic domains; magnetic moments; magnetic thin films; nanostructured materials; nanotechnology; pulsed laser deposition; silicon; strontium compounds; texture; X-ray diffraction; DOUBLE-PEROVSKITE SR2FEMOO6; LOW-FIELD MAGNETORESISTANCE; THIN-FILMS; SPINTRONICS; DISORDER;
D O I
10.1063/1.3073897
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanocrystalline Sr2FeMoO6 films have been grown on a Si(100) substrate by pulsed laser deposition under different growth conditions including deposition temperature and time. A nanocrystalline single-phase Sr2FeMoO6 film was obtained at a temperature as low as 600 degrees C. This high-quality ferromagnetic film was found to have a saturation magnetic moment of 3.4 mu(B) per formula unit and a coercive field of 1.5 kOe at 77 K with micrometer-sized magnetic domains. By using glancing-incidence x-ray diffraction with different incident beam angles, the crystal structure of the film was sampled as a function of depth. For the as-grown Sr2FeMoO6 films thicker than 60 nm, a preferential orientation of the nanocrystals in the film was observed, despite the lack of good lattice matching with the Si substrate. At a higher deposition temperature of 800 degrees C, the as-grown film exhibited the same saturation magnetic moment but with a discernibly lower coercive field of 0.8 kOe, consistent with the larger grain size obtained at a higher growth temperature.
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页数:6
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共 33 条
  • [1] Room-temperature magnetic and magneto-optical properties of Sr2FeMoO6 thin films
    Asano, H
    Osugi, M
    Kohara, Y
    Higashida, D
    Matsui, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (08): : 4883 - 4885
  • [2] Characterization methods of epitaxial Sr2FeMoO6 thin films
    Besse, M
    Pailloux, F
    Barthélémy, A
    Bouzehounane, K
    Fert, A
    Olivier, J
    Durand, O
    Wyczisk, F
    Bisaro, R
    Contour, JP
    [J]. JOURNAL OF CRYSTAL GROWTH, 2002, 241 (04) : 448 - 454
  • [3] Birkholz M, 2006, THIN FILM ANALYSIS BY X-RAY SCATTERING, P1
  • [4] Chrisey D. B., 1994, Pulsed Laser Deposition of Thin Films
  • [5] Use of glancing angle x-ray powder diffractometry to depth-profile phase transformations during dissolution of indomethacin and theophylline tablets
    Debnath, S
    Predecki, P
    Suryanarayanan, R
    [J]. PHARMACEUTICAL RESEARCH, 2004, 21 (01) : 149 - 159
  • [6] Double perovskite Sr2FeMoO6 films:: Growth, structure, and magnetic behavior
    Di Trolio, A.
    Larciprete, R.
    Testa, A. M.
    Fiorani, D.
    Imperatori, P.
    Turchini, S.
    Zema, N.
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 100 (01)
  • [7] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING
    DOERNER, MF
    BRENNAN, S
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) : 126 - 131
  • [8] Spintronics: A challenge for materials science and solid-state chemistry
    Felser, Claudia
    Fecher, Gerhard H.
    Balke, Benjamin
    [J]. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2007, 46 (05) : 668 - 699
  • [9] Galasso F., 1969, Structure, properties and preparation of perovskite type compounds
  • [10] Finding universal correlations between cationic disorder and low field magnetoresistance in FeMo double perovskite series
    Garcia-Hernández, M
    Martínez, JL
    Martínez-Lope, MJ
    Casais, MT
    Alonso, JA
    [J]. PHYSICAL REVIEW LETTERS, 2001, 86 (11) : 2443 - 2446