Power loss prognosis from thermographic images of PID affected silicon solar modules

被引：52

作者：

Kaden, Thomas ^{[1
]}

Lammers, Katrin ^{[1
]}

Moeller, Hans Joachim ^{[1
]}

机构：

[1] Fraunhofer Technol Ctr Semicond Mat THM Freiberg, D-09599 Freiberg, Germany

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2015年 / 142卷

关键词：

Silicon solar modules; Potential induced degradation; Thermography; Electroluminescence; POTENTIAL-INDUCED DEGRADATION;

D O I：

10.1016/j.solmat.2015.05.028

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

The potential induced degradation (PID) of silicon solar modules was investigated in detail in the past years. Nevertheless, even new PV installations exhibit a significant power loss of the system due to PID damage. In this contribution, thermography imaging is shown to be a fast and reliable tool for the detection of PID affected modules to be used in a PV system under operation. Especially the usage of remote controlled multicopters, equipped with a thermographic camera system reduces time and effort to investigate a whole PV installation. PID affected modules yield characteristic temperature patterns in the thermographic iMageS that are comparable to the intensity patterns observed by electroluminescence imaging. A prognosis procedure to directly give an estimate of the power loss of PID affected modules from thermographic images is presented. Hence, the power loss due to PID can be estimated without dismounting the concerned modules from the system. The procedure is successfully applied to a PV system containing modules with different levels of PID damage. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：24 / 28

页数：5

共 8 条

[1] On the mechanism of potential-induced degradation in crystalline silicon solar cells [J].

Bauer, J. ;

Naumann, V. ;

Grosser, S. ;

Hagendorf, C. ;

Schuetze, M. ;

Breitenstein, O. .

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2012, 6 (08) :331-333

[2]

Berghold J., 2010, Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition and the 5th World Conference on Photovoltaic Energy Conversion, P3753

[3]

Buerhop Claudia, 2012, 27th European Photovoltaic Solar Energy Conference and Exhibition. Proceedings, P3370

[4]

Kaden T., 2013, P 28 EUR PHOT SOL EN, P3347

[5]

Kaden Thomas, 2014, P 29 EUR PHOT SOL EN, P2994

[6] The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells [J].

Naumann, Volker ;

Lausch, Dominik ;

Graff, Andreas ;

Werner, Martina ;

Swatek, Sina ;

Bauer, Jan ;

Haehnel, Angelika ;

Breitenstein, Otwin ;

Grosser, Stephan ;

Bagdahn, Joerg ;

Hagendorf, Christian .

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2013, 7 (05) :315-318

[7]

Schutze M., 2011, 2011 37th IEEE Photovoltaic Specialists Conference (PVSC 2011), P000821, DOI 10.1109/PVSC.2011.6186080

[8]

Swanson R., 2005, Proceedings of the 15th International Photovoltaic Science Engineering Conference, P410

← 1 →