Influence of Water Expulsion on Structural Properties of V2O5 nH2O Sol-Gel Films

被引:5
作者
Gokdemir, F. Pinar [1 ]
Menda, U. Deneb [1 ]
Kavak, Pelin [1 ]
Saatci, A. Evrim [1 ]
Ozdemir, Orhan [1 ]
Kutlu, Kubilay [1 ]
机构
[1] Yildiz Tech Univ, Dept Phys, Istanbul, Turkey
来源
2ND INTERNATIONAL ADVANCES IN APPLIED PHYSICS AND MATERIALS SCIENCE CONGRESS | 2012年 / 1476卷
关键词
vanadium pentoxide; two stage mass loss; negative thermal expansion; VANADIUM;
D O I
10.1063/1.4751611
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Vanadium pentoxide (V2O5) thin films were prepared by dip-coating sol-gel technique by dissolving V2O5 powder in hydrogen peroxide (H2O2), the solution, leading V2O5 sol-gel nanocrystalline films. The films under preparation were exposed different hydration states, n, varying from 6 to 2 determined via XRD measurements. Water molecules were adsorbed in layered structure of V2O5 oxide films and hence the adsorption could be described as an intercalation in which the molecules were trapped in some cavities and were not randomly oriented. (00l) pattern of X-ray diffraction analysis not only approved the one dimensional stacking of V2O5 ribbons but also served to determine basal distance from which hydration state was guessed. The basal distance were calculated from the position of 00l peak and varied from 17.2 angstrom to 10.6 angstrom that corresponded to n= 6 to n= 2 respectively. During the water departure upon heating, the basal distance reduced by steps of 2.8 angstrom (diameter of vander Walls water molecule) towards 8.8 angstrom value, attributed to n= 0.5. Contrary to common belief of three-step mass loss (two of them were ascribed water expulsion), the process took place in two steps in thermogravimetric and differential thermal analysis (TG/DTA) measurements. During the first step, decrease in d exhibited huge endothermic negative thermal expansion of V2O5 nH(2)O sol while crystallization into orthorhombic V2O5 occurred at 357 degrees C (exhothermic peak) in TG as last step.
引用
收藏
页码:279 / 284
页数:6
相关论文
共 11 条
[1]   Giant extrinsic negative thermal expansion in vanadium pentoxide nanocrystalline films [J].
Bahgat, A. A. ;
Al-Hajry, A. ;
El-Desoky, M. M. .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (08) :1999-2006
[2]   Sol-gel-derived vanadium and titanium oxides as cathode materials in high-temperature lithium polymer electrolyte cells [J].
Davies, A ;
Hobson, RJ ;
Hudson, HLJ ;
Macklin, WJ ;
Neat, RJ .
JOURNAL OF MATERIALS CHEMISTRY, 1996, 6 (01) :49-56
[3]  
Gokdemir F. P., 2011, E MRS FALL M 2011 WA
[4]   Sol-gel synthesis and characterization of V2O5 powders [J].
Gotic, M ;
Popovic, S ;
Ivanda, M ;
Music, S .
MATERIALS LETTERS, 2003, 57 (21) :3186-3192
[5]   Effect of mesoporosity of vanadium oxide prepared by sol-gel process as cathodic material evaluated by cyclability during Li+ insertion/deinsertion [J].
Guerra, Elidia M. ;
Cestarolli, Dane T. ;
Oliveira, Herenilton P. .
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 2010, 54 (01) :93-99
[6]  
Hajzeri M., 2011, SOLAR ENERGY MAT SOL, V10, P531
[7]   Electrical and electrochemical characterization of poly (ethylene oxide)/V2O5 xerogel electrochromic films [J].
Jin, Aiping ;
Chen, Wen ;
Zhu, Quanyao ;
Yang, Ying ;
Volkov, Victor L. ;
Zakharova, Galina S. .
SOLID STATE IONICS, 2008, 179 (21-26) :1256-1262
[8]   LITHIUM INCORPORATION BY VANADIUM PENTOXIDE [J].
MURPHY, DW ;
CHRISTIAN, PA ;
DISALVO, FJ ;
WASZCZAK, JV .
INORGANIC CHEMISTRY, 1979, 18 (10) :2800-2803
[9]   Electrochemical lithium intercalation into vanadium pentoxide xerogel film electrode [J].
Pyun, SI ;
Bae, JS .
JOURNAL OF POWER SOURCES, 1997, 68 (02) :669-673
[10]   Self assembled V2O5 nanorods for gas sensors [J].
Raj, A. Dhayal ;
Pazhanivel, T. ;
Kumar, P. Suresh ;
Mangalaraj, D. ;
Nataraj, D. ;
Ponpandian, N. .
CURRENT APPLIED PHYSICS, 2010, 10 (02) :531-537