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5G AND "IMT FOR 2020 AND BEYOND"
被引:113
作者
:
Marcus, Michael J.
论文数:
0
引用数:
0
h-index:
0
机构:
Marcus Spectrum Solut, Cabin John, MD 20818 USA
Virginia Tech, Dept Elect & Comp Engn, Blacksburg, VA USA
Marcus Spectrum Solut, Cabin John, MD 20818 USA
Marcus, Michael J.
[
1
,
2
]
机构
:
[1]
Marcus Spectrum Solut, Cabin John, MD 20818 USA
[2]
Virginia Tech, Dept Elect & Comp Engn, Blacksburg, VA USA
来源
:
IEEE WIRELESS COMMUNICATIONS
|
2015年
/ 22卷
/ 04期
关键词
:
D O I
:
10.1109/MWC.2015.7224717
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:2 / 3
页数:2
相关论文
共 2 条
[1]
MARCUS MJ, 2014, IEEE WIREL COMMUN, V21, P8
[2]
Millimeter-Wave Cellular Wireless Networks: Potentials and Challenges
[J].
Rangan, Sundeep
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Rangan, Sundeep
;
Rappaport, Theodore S.
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Rappaport, Theodore S.
;
Erkip, Elza
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Erkip, Elza
.
PROCEEDINGS OF THE IEEE,
2014,
102
(03)
:366
-385
←
1
→
共 2 条
[1]
MARCUS MJ, 2014, IEEE WIREL COMMUN, V21, P8
[2]
Millimeter-Wave Cellular Wireless Networks: Potentials and Challenges
[J].
Rangan, Sundeep
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Rangan, Sundeep
;
Rappaport, Theodore S.
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Rappaport, Theodore S.
;
Erkip, Elza
论文数:
0
引用数:
0
h-index:
0
机构:
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
NYU, Polytech Sch Engn, NYU WIRELESS Ctr, Brooklyn, NY 11210 USA
Erkip, Elza
.
PROCEEDINGS OF THE IEEE,
2014,
102
(03)
:366
-385
←
1
→