Manipulation of insulated molecular wire with atomic force microscope

被引：17

作者：

Akai, T ^{[1
]}

Abe, T ^{[1
]}

Shimomura, T ^{[1
]}

Ito, K ^{[1
]}

机构：

[1] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Bunkyo Ku, Tokyo 1138656, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2001年 / 40卷 / 12A期

关键词：

conducting polymer; cyclodextrin; molecular nanotube; molecular devices; insulated molecular wire; atomic force microscope; molecular manipulation;

D O I：

10.1143/JJAP.40.L1327

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Recently, we have reported the formation of an insulated molecular wire of a conducting polymer, emeraldine base polyaniline, and a molecular nanotube synthesized from alpha-cyclodextrin. In this study, we manipulated the insulated molecular wire with the cantilever tip of an atomic force microscope (AFM). We found that the insulated molecular wire was moved or cut off by the manipulation process. The results of manipulation with varying AFM tip loading forces indicated that the insulated molecular wire is cut off at loading forces larger than approximately 30 nN.

引用

页码：L1327 / L1329

页数：3

共 50 条

[21] HCl-doping of insulated molecular wire formed by emeraldine base polyaniline and molecular nanotube
Akai, T
Shimomura, T
Ito, K
SYNTHETIC METALS, 2003, 135 (1-3) : 777 - 778
[22] MOLECULAR RESOLUTION OF THIN, HIGHLY ORIENTED POLY(TETRAFLUOROETHYLENE) FILMS WITH THE ATOMIC FORCE MICROSCOPE
HANSMA, H
MOTAMEDI, F
SMITH, P
HANSMA, P
WITTMAN, JC
POLYMER, 1992, 33 (03) : 647 - 649
[23] Experimental manipulation of gold nano-particles by Atomic Force Microscope and investigating effect of various working parameters
Zavareh, Seyed Abbas Shahmoradi
Moayyer, Hamid Akbari
Ahouei, Mohammad Amin
ULTRAFINE GRAINED AND NANO-STRUCTURED MATERIALS IV, 2014, 829 : 831 - +
[24] Neural network sliding mode controller of atomic force microscope-based manipulation with different cantilever probes
Korayem, Moharram H.
Esmaeilzadehha, Soliman
MICROSCOPY RESEARCH AND TECHNIQUE, 2019, 82 (07) : 993 - 1003
[25] Microcutting of polymethyl methecrylate by atomic force microscope
Zhu, JJ
Zuo, DW
Gu, N
Lu, ZH
ADVANCES IN ABRASIVE PROCESSES, 2001, 202-2 : 321 - 324
[26] Mask CD measurements with an atomic force microscope
Yoshida, Y
Sasaki, S
Abe, T
Mohri, H
Hayashi, N
PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XI, 2004, 5446 : 759 - 769
[27] Step height measurement by Atomic Force Microscope
Lui, PKW
Chen, YL
Chen, CJ
Peng, GS
Lin, VTY
PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 2, 2002, : 29 - 33
[28] LINEARITY MEASUREMENT IN AN ATOMIC-FORCE MICROSCOPE
Rakov, A. V.
Novikov, Yu. A.
Todua, P. A.
MEASUREMENT TECHNIQUES, 2008, 51 (06) : 594 - 598
[29] Pitch measurement by traceable atomic force microscope
Chen, Chao-Jung
Chen, Yen-Liang
Chang, Liang-Chih
International Journal of Nanoscience, Vol 2, Nos 4 and 5, 2003, 2 (4-5): : 335 - 341
[30] Testing of MEMS structure by atomic force microscope
Fok, L. M.
Fung, K. M.
Liu, Y. H.
Li, Wen J.
2006 1ST IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, 2006, : 1536 - +

← 1 2 3 4 5 →