Morphology and in situ deformation of polyamide films investigated with scanning force microscopy

被引：0

作者：

Drechsler, D ^{[1
]}

Karbach, A ^{[1
]}

Fuchs, H ^{[1
]}

机构：

[1] BAYER AG,ZENT FORSCH,POLYMER PHYS,D-47812 KREFELD,GERMANY

来源：

SURFACE AND INTERFACE ANALYSIS | 1997年 / 25卷 / 7-8期

关键词：

scanning force microscopy; polymers; polyamide; tensile tester;

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The structure and the mechanical properties of polyamide (PA) films were studied with scanning force microscopy (SFM). The spherulitic structure of the films was resolved and the amorphous and crystalline regions could be identified without heavy metal staining or evaporation. The identification was achieved with different contrast mechanisms in SFM, such as the force modulation technique and phase imaging. The mechanical properties of the PA films were investigated with a tensile tester. The films were drawn in a uniaxial direction. The deformation of the spherulite structures could be imaged by in situ SFM. A schematic model for the interpretation of the observed structures is presented. (C) 1997 by John Wiley & Sons, Ltd.

引用

页码：537 / 542

页数：6

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