Automated Simulation of Scanning Tunneling Microscope Functional Parameters

被引：0

作者：

Maisakovskyi, Roman ^{[1
]}

Kolesnyk, Konstantin ^{[1
]}

Panchak, Roman ^{[1
]}

Golovatskyy, Ruslan ^{[1
]}

机构：

[1] Lviv Polytech Natl Univ, Comp Assisted Design Syst Dept, Stepan Bandera Str 12, Lvov, Ukraine

来源：

2016 XII International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) | 2016年

关键词：

Scanning tunneling microscope; tunneling; simulation; microscope; MATLAB;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper cantilever detection methods of microscopy that allow to get an image of surface with high spatial resolution are discussed. The functionality of the scanning tunneling microscope and principle of its operation are analyzed. Basing on the simulated data, it is possible to show how microscope operating parameters affect the results of its measurements.

引用

页码：107 / 109

页数：3