Growth and properties of Ge1-xSix mosaic single crystals for γ-ray lens application

被引：18
作者：
Abrosimov, N. V. [1 ]
Luedge, A. [1 ]
Riemann, H. [1 ]
Kurlov, V. N. [2 ]
Borissova, D. [3 ]
Klemm, V. [3 ]
Halloin, H. [4 ]
von Ballmoos, P. [4 ]
Bastie, P. [5 ]
Hamelin, B. [5 ]
Smither, R. K. [6 ]
机构：
[1] Inst Crystal Growth, D-12489 Berlin, Germany
[2] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia
[3] Freiberg Univ Min & Technol, Inst Mat Sci, D-09599 Freiberg, Germany
[4] Ctr Etud Spatiale Rayonnements, F-31029 Toulouse, France
[5] Inst Max Von Laue Paul Langevin, F-38042 Grenoble, France
[6] Argonne Natl Lab, Argonne, IL 60439 USA
来源：
JOURNAL OF CRYSTAL GROWTH | 2005年 / 275卷 / 1-2期
关键词：
Crystal structure; Interfaces; Solid solutions; Czochralski method; Germanium silicon alloys; Mosaicc rystals;
D O I：
10.1016/j.jcrysgro.2004.11.110
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Bulk crystals of Ge1-xSix solid solutions grown by modified Czochralski (CZ) technique were used for the production of the diffraction optics elements of the high-energy gamma-ray telescope. The mosaic crystals were grown to improve the diffraction efficiency of the crystal lens. For developing growth methods for such crystals, the shape of the growth interface, the striation pattern of the distribution of the components and the mosaic structure must be known. Applying the lateral photovoltage scanning (LPS) method and optical microscopy their mosaic structure and shapes of the growth interface have been determined. In this paper, the first attempt was made to find the correlation between crystal structure, mosaicity and diffraction efficiency of Ge1-xSix-based gamma-ray optical elements. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：E495 / E500
页数：6
相关论文
共 11 条
  • [1] Czochralski growth of Si- and Ge-rich SiGe single crystals
    Abrosimov, NV
    Rossolenko, SN
    Thieme, W
    Gerhardt, A
    Schroder, W
    [J]. JOURNAL OF CRYSTAL GROWTH, 1997, 174 (1-4) : 182 - 186
  • [2] Single crystal growth of Si1-xGex by the Czochralski technique
    Abrosimov, NV
    Rossolenko, SN
    Alex, V
    Gerhardt, A
    Schroder, W
    [J]. JOURNAL OF CRYSTAL GROWTH, 1996, 166 (1-4) : 657 - 662
  • [3] Lateral photovoltage scanning (LPS) method for the visualization of the solid-liquid interface of Si1-xGex single crystals
    Abrosimov, NV
    Lüdge, A
    Riemann, H
    Schröder, W
    [J]. JOURNAL OF CRYSTAL GROWTH, 2002, 237 : 356 - 360
  • [4] COURTOIS P, 2002, ILL ANN REPORT
  • [5] Erko A, 2002, CRYST RES TECHNOL, V37, P685, DOI 10.1002/1521-4079(200207)37:7<685::AID-CRAT685>3.0.CO
  • [6] 2-Z
  • [7] CLAIRE gamma-ray lens:: flight and long distance test results
    Halloin, H
    von Ballmoos, P
    Evrard, J
    Skinner, GK
    Hernanz, M
    Abrosimov, N
    Bastie, P
    Hamelin, B
    Lonjou, V
    Alvarez, JM
    Laurens, A
    Jean, P
    Knödlseder, J
    Smither, RK
    Vedrenne, G
    [J]. OPTICS FOR EUV, X-RAY AND GAMMA-RAY ASTRONOMY, 2004, 5168 : 471 - 481
  • [8] A new hard X-ray diffractometer (100-400 keV) for bulk crystalline analysis. Applications for non-destructive investigation
    Hamelin, B
    Bastie, P
    [J]. PENETRATING RADIATION SYSTEMS AND APPLICATIONS IV, 2002, 4786 : 29 - 39
  • [9] HURLE DTJ, 1994, HANDB CRYST GROWTH, V2, P99
  • [10] MAX -: a gamma-ray lens for nuclear astrophysics
    von Ballmoos, P
    Halloin, H
    Skinner, G
    Smither, B
    Paul, J
    Abrosimov, N
    Alvarez, J
    Astier, P
    Bastie, P
    Barret, D
    Bazzano, A
    Boutonnet, A
    Brousse, P
    Cordier, B
    Courvoisier, T
    DiDocco, G
    Giuliani, A
    Hamelin, B
    Hernanz, M
    Jean, P
    Isern, J
    Knödlseder, J
    Laurent, P
    Lebrun, F
    Marcowith, A
    Martinot, V
    Natalucci, L
    Olive, JF
    Pain, R
    Sadat, R
    Sainct, H
    Ubertini, P
    Vedrenne, G
    [J]. OPTICS FOR EUV, X-RAY AND GAMMA-RAY ASTRONOMY, 2004, 5168 : 482 - 491
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