The image-charge correction for curved field emitters

被引:15
作者
Biswas, Debabrata [1 ]
Ramachandran, Rajasree [1 ]
机构
[1] Bhabha Atom Res Ctr, Bombay 400085, Maharashtra, India
关键词
ELECTRON-EMISSION; FOWLER; BARRIER;
D O I
10.1063/1.4990562
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The image-charge potential plays a key role in field emission by lowering the potential barrier, thereby leading to an increase in current density by orders of magnitude. The classical image-harge potential is however strictly applicable to planar emitters rather than the curved protrusions characteristic of field emission sites. Using recent results [Jensen et al., J. Vac. Sci. Technol. B 35, 02C101 (2017)] for a hyperboloid emitting surface, we show that for a charge close to the emitter surface, the image charge magnitude and location are well approximated by replacing the surface locally by a sphere having the same radius of curvature. Corrections to the image-charge potential under this approximation are calculated and found to be significant for field emission when the radius of curvature is in the nanometer regime. In such cases, there is reduced electron emission and the effect is more pronounced at lower external field strengths. Published by AIP Publishing.
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页数:5
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