All-van-der-Waals Barrier-Free Contacts for High-Mobility Transistors (vol 33, 2109521, 2021)

被引:47
作者
Zhang, Xiankun
Yu, Huihui
Tang, Wenhui
Wei, Xiaofu
Gao, Li
Hong, Mengyu
Liao, Qingliang
Kang, Zhuo
Zhang, Zheng
Zhang, Yue
机构
[1] Academy for Advanced Interdisciplinary Science and Technology, Beijing Advanced Innovation Center for Materials Genome Engineering, University of Science and Technology Beijing, Beijing
[2] Beijing Key Laboratory for Advanced Energy Materials and Technologies, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing
基金
中国国家自然科学基金;
关键词
all-van-der-Waals contacts; Fermi-level pinning; metal–semiconductor contacts; Schottky barrier; transistors; van der Waals semimetals; work function;
D O I
10.1002/adma.202202345
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Ultrathin 2D semiconductor devices are considered to have beyond-silicon potential but are severely troubled by the high Schottky barriers of the metal–semiconductor contacts, especially for p-type semiconductors. Due to the severe Fermi-level pinning effect and the lack of conventional semimetals with high work functions, their Schottky hole barriers are hardly removed. Here, an all-van-der-Waals barrier-free hole contact between p-type tellurene semiconductor and layered 1T′-WS2 semimetal is reported, which achieves a zero Schottky barrier height of 3 ± 9 meV and a high field-effect mobility of ≈1304 cm2 V–1 s–1. The formation of such contacts can be attributed to the higher work function of ≈4.95 eV of the 1T′-WS2 semimetal, which is in sharp contrast with low work function (4.1–4.7 eV) of conventional semimetals. The study defines an available strategy for eliminating the Schottky barrier of metal–semiconductor contacts, facilitating 2D-semiconductor-based electronics and optoelectronics to extend Moore's law. © 2022 Wiley-VCH GmbH.
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页数:1
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