Is negative capacitance FET a steep-slope logic switch? (vol 11, 196, 2020)

被引:0
|
作者
Cao, Wei
Banerjee, Kaustav
机构
[1] Department of Electrical and Computer Engineering, University of California, Santa Barbara, 93106, CA
关键词
D O I
10.1038/s41467-020-14795-y
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The negative-capacitance field-effect transistor(NC-FET) has attracted tremendous research efforts. However, the lack of a clear physical picture and design rule for this device has led to numerous invalid fabrications. In this work, we address this issue based on an unexpectedly concise and insightful analytical formulation of the minimum hysteresis-free subthreshold swing (SS), together with several important conclusions. Firstly, well-designed MOSFETs that have low trap density, low doping in the channel, and excellent electrostatic integrity, receive very limited benefit from NC in terms of achieving subthermionic SS. Secondly, quantum-capacitance is the limiting factor for NC-FETs to achieve hysteresis-free subthermionic SS, and FETs that can operate in the quantum-capacitance limit are desired platforms for NC-FET construction. Finally, a practical role of NC in FETs is to save the subthreshold and overdrive voltage losses. Our analysis and findings are intended to steer the NC-FET research in the right direction. © 2020, The Author(s).
引用
收藏
页数:1
相关论文
共 50 条
  • [21] Ferroelectric HfZrOx-based MoS2 negative capacitance transistor with ITO capping layers for steep-slope device application
    Xu, Jing
    Jiang, Shu-Ye
    Zhang, Min
    Zhu, Hao
    Chen, Lin
    Sun, Qing-Qing
    Zhang, David Wei
    APPLIED PHYSICS LETTERS, 2018, 112 (10)
  • [22] Design and Simulation of Steep-Slope Silicon-On-Insulator FETs using Negative Capacitance: Impact of Buried Oxide Thickness and Remnant Polarization
    Ota, Hiroyuki
    Migita, Shinji
    Hattori, Junichi
    Fukuda, Koichi
    Toriumi, Akira
    2016 IEEE 16TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2016, : 770 - 772
  • [23] Steep-Slope and Hysteresis-Free MoS2 Negative-Capacitance Transistors Using Single HfZrAlO Layer as Gate Dielectric
    Tao, Xinge
    Liu, Lu
    Xu, Jingping
    NANOMATERIALS, 2022, 12 (24)
  • [24] Ferroelectric gating of two-dimensional semiconductors for the integration of steep-slope logic and neuromorphic devices
    Kamaei, Sadegh
    Liu, Xia
    Saeidi, Ali
    Wei, Yingfen
    Gastaldi, Carlotta
    Brugger, Juergen
    Ionescu, Adrian M.
    NATURE ELECTRONICS, 2023, 6 (9) : 658 - 668
  • [25] Ferroelectric gating of two-dimensional semiconductors for the integration of steep-slope logic and neuromorphic devices
    Sadegh Kamaei
    Xia Liu
    Ali Saeidi
    Yingfen Wei
    Carlotta Gastaldi
    Juergen Brugger
    Adrian M. Ionescu
    Nature Electronics, 2023, 6 : 658 - 668
  • [26] Steep-subthreshold slope dual gate negative capacitance junction less FET with dead channel: TCAD approach for digital/RF applications
    Chaudhary, Shalini
    Dewan, Basudha
    Sahu, Chitrakant
    Yadav, Menka
    MICROELECTRONICS JOURNAL, 2022, 127
  • [27] Experimental Details of a Steep-Slope Ferroelectric InGaAs Tunnel-FET With High-Quality PZT and Modeling Insights in the Transient Polarization
    Verhulst, Anne S.
    Saeidi, Ali
    Stolichnov, Igor
    Alian, Alireza
    Iwai, Hiroshi
    Collaert, Nadine
    Ionescu, Adrian M.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (01) : 377 - 382
  • [28] Extremely Steep Switch of Negative-Capacitance Nanosheet GAA-FETs and FinFETs
    Lee, M. H.
    Chen, K-T.
    Liao, C-Y.
    Gu, S-S.
    Siang, G-Y.
    Chou, Y-C.
    Chen, H-Y.
    Le, J.
    Hong, R-C.
    Wang, Z-Y.
    Chen, S-Y.
    Chen, P-G.
    Tang, M.
    Lin, Y-D.
    Lee, H-Y.
    Li, K-S.
    Liu, C. W.
    2018 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2018,
  • [29] Steep Slope Silicon-on-Insulator Field Effect Transistor with Negative Capacitance: Analysis on Hysteresis
    Ko, Eunah
    Shin, Jaemin
    Shin, Changhwan
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2019, 19 (10) : 6128 - 6130
  • [30] A perspective on steep-subthreshold-slope negative-capacitance field-effect transistor
    Kobayashi, Masaharu
    APPLIED PHYSICS EXPRESS, 2018, 11 (11)