Fluctuations and criticality in the random-field Ising model (vol 87, 032119, 2013)

被引：0
作者：
Theodorakis, Panagiotis E.
Georgiou, Ioannis
Fytas, Nikolaos G.
机构：
[1] Department of Chemical Engineering, Imperial College London
[2] Institute for Theoretical Physics, Center for Computational Materials Science, Vienna University of Technology, A-1040 Vienna
[3] Department of Physics, University of Athens, Panepistimiopolis, GR 15784 Zografos, Athens
[4] Applied Mathematics Research Centre, Coventry University, Coventry
来源：
PHYSICAL REVIEW E | 2013年 / 87卷 / 03期
关键词：
D O I：
10.1103/PhysRevE.87.039901
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
We investigate the critical properties of the d = 3 random-field Ising model with a Gaussian field distribution at zero temperature. By implementing suitable graph-theoretical algorithms, we perform a large-scale numerical simulation of the model for a vast range of values of the disorder strength h and system sizes V = L x L x L, with L <= 156. Using the sample-to-sample fluctuations of various quantities and proper finite-size scaling techniques we estimate with high accuracy the critical disorder strength h(c) and the correlation length exponent nu. Additional simulations in the area of the estimated critical-field strength and relevant scaling analysis of the bond energy suggest bounds for the specific heat critical exponent alpha and the violation of the hyperscaling exponent theta. Finally, a data collapse analysis of the order parameter and disconnected susceptibility provides accurate estimates for the critical exponent ratios beta/nu and (gamma) over bar/nu, respectively. DOI: 10.1103/PhysRevE.87.032119
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页数：1
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