Special issue on 2001 IEEE European Test Workshop

被引：0

|

作者：

Agrawal, VD

机构：

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2002年 / 18卷 / 02期

关键词：

D O I：

10.1023/A:1014973010782

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：103 / 104

页数：2

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