Mechanisms for the degradation of phosphor excitation efficiency by short wavelength vacuum ultraviolet radiation in plasma discharge devices

被引：4
作者：
Takeda, Eiji [1 ,2 ]
Zukawa, Takehiro [3 ]
Ishibashi, Tasuku [4 ]
Yoshino, Kyohei [5 ]
Morita, Yukihiro [3 ,6 ]
Fujii, Minoru [1 ]
机构：
[1] Kobe Univ, Grad Sch Engn, Dept Elect & Elect Engn, Nada Ku, 1-1 Rokkoudai, Kobe, Hyogo 6578501, Japan
[2] Panasonic Corp, Automot & Ind Syst Co, Engn Div, Sensing Solut Dev Ctr, 1006 Kadoma, Kadoma, Osaka 5718506, Japan
[3] Panasonic Corp, Technol Innovat Div, Inst Sensors & Devices, 1006 Kadoma, Kadoma, Osaka 5718508, Japan
[4] Panasonic Corp, Eco Solut Co, Housing Syst Business Div, 1048 Kadoma, Kadoma, Osaka 5718686, Japan
[5] Panasonic Corp, Automot & Ind Syst Co, Automot Infotainment Syst Business Div, 4261 Ikonobe, Yokohama, Kanagawa 2248520, Japan
[6] Osaka Univ, Grad Sch Engn, Panasonic Device Sci Res Alliance Lab, 1-1 Yamadaoka, Suita, Osaka 5650871, Japan
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2019年 / 124卷
关键词：
plasma discharge; Luminous degradation; Organic residue; Protective layer; DIELECTRIC BARRIER DISCHARGE; DISPLAY PANEL; MGO; SURFACE; IMPROVEMENT; EMISSION; LIFETIME; HISTORY; PHYSICS; LAYER;
D O I：
10.1016/j.jpcs.2018.08.033
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The mechanism for the degradation of phosphor excitation efficiency in flat panel plasma discharge devices was investigated. We found that remaining organic compounds contained in the binders of phosphors were transformed to vacuum ultraviolet (VUV) absorbing substances over prolonged aging, which reduce the excitation efficiency of a phosphor, especially in the shorter wavelength VUV range. We also demonstrated that re-deposition of a sputtered protective layer on a phosphor further reduced the luminescence excitation efficiency due to the absorption of VUV radiation by the layer.
引用
收藏
页码：274 / 280
页数：7
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