XPS insights: Asymmetric peak shapes in XPS

被引：35

作者：

Morgan, David J. ^{[1
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机构：

[1] Cardiff Univ, Cardiff Catalysis Inst, Translat Res Hub, Cardiff, Wales

[2] Cardiff Univ, Sch Chem, Cardiff, Wales

[3] HarwellXPS The EPSRC Natl Facil Photoelectron Spec, Res Complex Harwell RCaH, Didcot, Oxfordshire, England

[4] Cardiff Univ, Cardiff Catalysis Inst, Translat Res Hub, Maindy Rd, Cardiff CF24 4HQ, Wales

来源：

SURFACE AND INTERFACE ANALYSIS | 2023年 / 55卷 / 08期

基金：

英国工程与自然科学研究理事会;

关键词：

asymmetry; fitting; peak; XPS; X-RAY-PHOTOEMISSION; CORE-LINE ASYMMETRIES; ELECTRONIC-STRUCTURE; SPECTRA;

D O I：

10.1002/sia.7215

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The misinterpretation of peak asymmetry as higher oxidation states in x-ray photoelectron spectroscopy (XPS) is regretfully all too common. This XPS Insight note introduces the theory of peak asymmetry in x-ray photoelectron spectra and such asymmetry is discussed for a range of different classes of materials to afford analysts a more informed view of their spectra.

引用

页码：567 / 571

页数：5

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