Hard x-ray photoelectron spectroscopy reference spectra of W with Cr Kα excitation

被引：2

作者：

Zheng, Dong ^{[1
]}

Young, Christopher N. ^{[2
]}

Stickle, William F. ^{[2
]}

机构：

[1] HP Singapore Private Ltd, Adv Mat & Test Ctr, 138 Depot Rd, Singapore 109683, Singapore

[2] HP Inc, Analyt & Dev Labs, Corvallis, OR 97330 USA

来源：

SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 02期

关键词：

HAXPES; Auger; W; Tungsten; Cr K-alpha;

D O I：

10.1116/6.0003061

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Hard x-ray photoelectron spectroscopy using monochromatic Cr K-alpha radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered W sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.

引用

页数：13