Solid/Solid State Interfacial Reactions in the Sn-9Zn/Cu-Based Alloys (C1990 HP, Alloy 25, and C194) Couples

被引:2
作者
Laksono, Andromeda Dwi [1 ]
Al-Audhah, Lutfi Yunus Wahab [1 ]
Chen, Chih-Ming [2 ]
Ho, Yu Xuan [1 ]
Yen, Yee-Wen [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mat Sci & Engn, Taipei 10672, Taiwan
[2] Natl Chung Hsing Univ, Dept Chem Engn, Taichung 402, Taiwan
关键词
LEAD-FREE SOLDER; INTERMETALLIC COMPOUND; MICROSTRUCTURE EVOLUTION; GROWTH-KINETICS; CU; ZN; BI; INTERCONNECTS; BEHAVIOR; LAYER;
D O I
10.1007/s11837-023-05827-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the kinetics of the intermetallic compound (IMC) growth during the solid/solid state reaction at 125-175 degrees C for 100-2000 h between Sn-9 wt.% Zn (SZ) with Cu-3.28 wt.%Ti (C1990 HP), Cu-2.0 wt.% Be (Alloy 25), and Cu-2.3 wt.% Fe (C194) alloys, respectively. The results revealed that both the CuZn5 and Cu5Zn8 phases were formed at early stage and the CuZn5 phase was transformed to the Cu5Zn8 phase when the aging temperature and time were increased in the SZ/C1990 HP couples. The CuZn5 and Cu5Zn8 phases were formed, and no phase transformation was observed in the SZ/Alloy 25 couples. In the SZ/C194 couples, only Cu5Zn8 phase formed at early stage of aging. The Sn tunneling phenomena promoted Cu-Sn IMC formed at a higher temperature and longer aging time. The Cu6Sn5 phase was formed around the Sn-rich matrix and consumed the Cu atom from the C194 substrate. A diffusion-controlled mechanism was responsible for IMC growth in all couples. The activation energy for overall IMCs was 51.1 kJ/mol on SZ/C1990 HP, 45.7 kJ/mol on SZ/Alloy 25 couples, and 87.0 kJ/mol on SZ/C194.
引用
收藏
页码:1889 / 1901
页数:13
相关论文
共 42 条
[1]  
CHAN Y, 2002, INT J MATER RES, V93, P95
[2]   Interfacial reactions in the Sn-9Zn-(xCu)/Cu and Sn-9Zn-(xCu)/Ni couples [J].
Chou, Chin-yi ;
Chen, Sinn-wen ;
Chang, Yee-shyi .
JOURNAL OF MATERIALS RESEARCH, 2006, 21 (07) :1849-1856
[3]   Phase equilibria of the Sn-Zn-Cu ternary system [J].
Chou, Chin-Yi ;
Chen, Sinn-Wen .
ACTA MATERIALIA, 2006, 54 (09) :2393-2400
[5]   Microstructural evolution of Sn-9Zn-3Bi solder/Cu joint during long-term aging at 170°C [J].
Duan, LL ;
Yu, DQ ;
Han, SQ ;
Ma, HT ;
Wang, L .
JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 381 (1-2) :202-207
[6]   Wetting and Interfacial Chemistry of SnZnCu Alloys with Cu and Al Substrates [J].
Fima, Przemysaw ;
Pstrus, Janusz ;
Gancarz, Tomasz .
JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 2014, 23 (05) :1530-1535
[7]  
Hu X.B, 2022, P INT C ELECT PACKAG
[8]   Interfacial reactions of lead-free Sn-Zn based solders on Cu and Cu plated electroless Ni-P/Au layer under aging at 150 °C [J].
Huang, CW ;
Lin, KL .
JOURNAL OF MATERIALS RESEARCH, 2004, 19 (12) :3560-3568
[9]   Abnormal Diffusion Behavior of Zn in Cu/Sn-9 wt.%Zn/Cu Interconnects During Liquid-Solid Electromigration [J].
Huang, M. L. ;
Zhou, Q. ;
Zhao, N. ;
Zhang, Z. J. .
JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (10) :2975-2982
[10]   Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder [J].
Islam, MN ;
Chan, YC ;
Rizvi, MJ ;
Jillek, W .
JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 400 (1-2) :136-144