Structural, Magnetic, and Magneto-Optical Properties of Thin Films of BaM Hexaferrite Grown by Laser Molecular Beam Epitaxy

Thin films of BaM hexaferrite (BaFe12O19) were grown on alpha-Al2O3(0001) substrates by laser molecular beam epitaxy. Structural, magnetic, and magneto-optical properties were studied using medium-energy ion scattering, energy dispersive X-ray spectroscopy, atomic force microscopy, X-ray diffraction, magneto-optical spectroscopy, and magnetometric techniques, and the dynamics of magnetization by ferromagnetic resonance method. It was shown that even a short time annealing drastically changes the structural and magnetic properties of films. Only annealed films demonstrate magnetic hysteresis loops in PMOKE and VSM experiments. The shape of hysteresis loops depends on thickness of films showing practically rectangular loops and high value of remnant magnetization (M-r/M-s similar to 99%) for thin films (50 nm) and much broader and sloped loops in thick (350-500 nm) films. The magnitude of magnetization 4 pi M-s approximate to 4.3 kG in thin films corresponds to that in bulk BaM hexaferrite. Photon energy and sign of bands in magneto-optical spectra of thin films correspond to ones observed earlier in bulk samples and films of BaM hexaferrite. FMR spectra of 50 nm films at 50 GHz consist of a number of narrow lines. The width of main line Delta H similar to 20 Oe is lower than has been reported up to now.