Deep-Learning-Based Automatic Detection of Photovoltaic Cell Defects in Electroluminescence Images

被引:20
作者
Wang, Junjie [1 ]
Bi, Li [1 ]
Sun, Pengxiang [2 ]
Jiao, Xiaogang [1 ]
Ma, Xunde [1 ]
Lei, Xinyi [3 ]
Luo, Yongbin [1 ]
机构
[1] Ningxia Univ, Coll Informat Engn, Yinchuan 750021, Peoples R China
[2] China Telecom Tianyi Cloud Technol Co Ltd, Chengdu 610000, Peoples R China
[3] Party Sch Sichuan Prov Comm CPC, Chengdu 610072, Peoples R China
基金
中国国家自然科学基金;
关键词
electroluminescence images; deep learning; defect detection; feature fusion; MODULE CELLS; CLASSIFICATION;
D O I
10.3390/s23010297
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Photovoltaic (PV) cell defect detection has become a prominent problem in the development of the PV industry; however, the entire industry lacks effective technical means. In this paper, we propose a deep-learning-based defect detection method for photovoltaic cells, which addresses two technical challenges: (1) to propose a method for data enhancement and category weight assignment, which effectively mitigates the impact of the problem of scant data and data imbalance on model performance; (2) to propose a feature fusion method based on ResNet152-Xception. A coordinate attention (CA) mechanism is incorporated into the feature map to enhance the feature extraction capability of the existing model. The proposed model was conducted on two global publicly available PV-defective electroluminescence (EL) image datasets, and using CNN, Vgg16, MobileNetV2, InceptionV3, DenseNet121, ResNet152, Xception and InceptionResNetV2 as comparative benchmarks, it was evaluated that several metrics were significantly improved. In addition, the accuracy reached 96.17% in the binary classification task of identifying the presence or absence of defects and 92.13% in the multiclassification task of identifying different defect types. The numerical experimental results show that the proposed deep-learning-based defect detection method for PV cells can automatically perform efficient and accurate defect detection using EL images.
引用
收藏
页数:21
相关论文
共 37 条
[1]   Review of Microcrack Detection Techniques for Silicon Solar Cells [J].
Abdelhamid, Mahmoud ;
Singh, Rajendra ;
Omar, Mohammed .
IEEE JOURNAL OF PHOTOVOLTAICS, 2014, 4 (01) :514-524
[2]   CNN based automatic detection of photovoltaic cell defects in electroluminescence images [J].
Akram, M. Waqar ;
Li, Guiqiang ;
Jin, Yi ;
Chen, Xiao ;
Zhu, Changan ;
Zhao, Xudong ;
Khaliq, Abdul ;
Faheem, M. ;
Ahmad, Ashfaq .
ENERGY, 2019, 189
[3]   Electroluminescence Imaging of PV Devices: Advanced Vignetting Calibration [J].
Bedrich, Karl ;
Bokalic, Matevz ;
Bliss, Martin ;
Topic, Marko ;
Betts, Thomas R. ;
Gottschalg, Ralph .
IEEE JOURNAL OF PHOTOVOLTAICS, 2018, 8 (05) :1297-1304
[4]  
Buerhop-Lutz C., 2018, 35 EUR PHOT SOL EN C, DOI [10.4229/35thEUPVSEC20182018-5CV.3.15, DOI 10.4229/35THEUPVSEC20182018-5CV.3.15]
[5]   Xception: Deep Learning with Depthwise Separable Convolutions [J].
Chollet, Francois .
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, :1800-1807
[6]   Segmentation of photovoltaic module cells in uncalibrated electroluminescence images [J].
Deitsch, Sergiu ;
Buerhop-Lutz, Claudia ;
Sovetkin, Evgenii ;
Steland, Ansgar ;
Maier, Andreas ;
Gallwitz, Florian ;
Riess, Christian .
MACHINE VISION AND APPLICATIONS, 2021, 32 (04)
[7]   Automatic classification of defective photovoltaic module cells in electroluminescence images [J].
Deitsch, Sergiu ;
Christlein, Vincent ;
Berger, Stephan ;
Buerhop-Lutz, Claudia ;
Maier, Andreas ;
Gallwitz, Florian ;
Riess, Christian .
SOLAR ENERGY, 2019, 185 :455-468
[8]  
Demirci M., 2019, INT C DAT SCI MACH L, P311
[9]   Efficient deep feature extraction and classification for identifying defective photovoltaic module cells in Electroluminescence images [J].
Demirci, Mustafa Yusuf ;
Besli, Nurettin ;
Gumuscu, Abduelkadir .
EXPERT SYSTEMS WITH APPLICATIONS, 2021, 175
[10]   Automatic Micro-Crack Detection of Polycrystalline Solar Cells in Industrial Scene [J].
Fan, Tao ;
Sun, Tao ;
Xie, Xiangying ;
Liu, Hu ;
Na, Zhixiong .
IEEE ACCESS, 2022, 10 :16269-16282