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Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO
被引:2
作者:
Gaffoor, M. Z.
[1
]
Jarvis, A. L. L.
[1
]
Swanson, A.
[1
]
机构:
[1] Univ KwaZulu Natal, Mat Sci Lab, ZA-4001 Durban, South Africa
关键词:
Yttrium barium copper oxide;
X-ray scattering;
Lattices;
Doping;
Deformable models;
Graphene;
Mechanical factors;
graphene oxide;
porosity and YBCO;
vickers hardness;
HIGH-TEMPERATURE SUPERCONDUCTOR;
HARDNESS;
SYSTEM;
D O I:
10.1109/TASC.2023.3253464
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
YBCO (Y1Ba2Cu3O7-d) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples decreased by a maximum of 29% and 17% for GO and rGO doped samples respectively. Microhardness measurements were conducted using the Vickers hardness method at loads in the range of 0.245 - 2.940 N. These micro hardness measurements were used to calculate the Vickers hardness (H-V), elastic modulus (E), yield strength (Y), fracture toughness (K-IC) and brittleness index (B) of the material. H-V was greater in GO doped samples than in rGO doped samples. E increased by 63.94% for rGO and 85.52% for GO doped samples. Y increased by 63.80% for rGO and 85.40% for GO doped samples. B decreased by 48.11% for rGO and 43.78% for GO doped samples. There was an increase in K-IC for both GO and rGO samples. The indentation size effect (ISE) was observed during micro-hardness measurements. This ISE behaviour was analyzed using Meyers Law, PSR model, elastic/plastic deformation model and Hays Kendall model. The results showed that the Hay Kendall approach best described the ISE behaviour of the samples.
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页数:9
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