High voltage response of graphene/4H-SiC UV photodetector with low level detection

被引:4
|
作者
Jehad, Ala K. [1 ,2 ]
Unverdi, Ozhan [2 ]
Celebi, Cem [1 ]
机构
[1] Izmir Inst Technol, Dept Phys, Quantum Device Lab, TR-35430 Izmir, Turkiye
[2] Yasar Univ, Fac Engn, Dept Elect & Elect Engn, TR-35100 Izmir, Turkiye
关键词
CVD-Graphene; UV Photodetector; Epitaxial; 4; H-SiC; Spectral voltage responsivity; Response speed; ULTRAVIOLET PHOTODETECTOR; TEMPERATURE; SENSITIVITY; GAN;
D O I
10.1016/j.jallcom.2023.172288
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A self-powered graphene/silicon carbide (G/4H-SiC) ultraviolet photodetector of a p-i-n like-structure with high voltage response has been fabricated to detect and measure low intensity ultraviolet (UV) radiation. Bilayer graphene sheet grown by chemical vapor deposition (CVD) method was transferred on the top of an epilayer structure of n-/n+ 4 H-SiC. In this structure, two Schottky contacts were formed: one at G/ n- 4H-SiC interface and the other at bulk-4 H-SiC/Cr/Au interface. The photodetector's characteristic measurements revealed low dark current of - 0.58 nA and spectral voltage responsivity of - 0.75 V/W at 300 nm wavelength. Under low level UV illumination of 300 nm wavelength, the photodetector exhibited a leakage current and a photogenerated response voltage of 1.1 nA and 10 mV, respectively. The time-dependent photovoltage measurements displayed a rapid photovoltage response with rise and decay times of -74 ns and - 580 ns, respectively. This novel device holds promise for applications requiring sensitive and self-powered UV detection.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] The Temperature Coefficient of Threshold Voltage for High Voltage 4H-SiC FinFET
    Wang, Q.
    Udrea, F.
    Fujioka, H.
    Tomita, H.
    Nishiwaki, T.
    Kumazawa, T.
    Kumita, M.
    Okuda, M.
    Fujiwara, H.
    IEEE ELECTRON DEVICE LETTERS, 2025, 46 (03) : 334 - 336
  • [22] Selective 4H-SiC UV detectors
    Evgenia, Kalinina
    Konstantinov, O.
    Lebedev, A.
    Gol'dberg, Yu
    SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 1014 - 1017
  • [23] Noise behavior of 4H-SiC MESFETs at low drain voltage
    Lab. Phys. Composants S., UMR-CNRS 5531, ENSERG, 23 rue des Martyrs, FR-38016 Grenoble Cedex 1, France
    不详
    不详
    Materials Science Forum, 2001, 353-356 : 703 - 706
  • [24] Noise behavior of 4H-SiC MESFETs at low drain voltage
    Banc, C
    Royet, AS
    Ouisse, T
    Bano, E
    Noblanc, O
    Brylinski, C
    SILICON CARBIDE AND RELATED MATERIALS, ECSCRM2000, 2001, 353-356 : 703 - 706
  • [25] Comparison of 6H-SiC and 4H-SiC high voltage planar ACCUFETs
    Chilukuri, RK
    Shenoy, PM
    Baliga, BJ
    ISPSD '98 - PROCEEDINGS OF THE 10TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 1998, : 115 - 118
  • [26] High quantum-efficiency 4H-SiC UV photodiode
    Park, KS
    Kimoto, T
    Matsunami, H
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1997, 30 (01) : 123 - 130
  • [27] High-temperature characterization of 4H-SiC Darlington transistors for low voltage applications
    Lanni, Luigia
    Malm, Bengt Gunnar
    Zetterling, Carl-Mikael
    Ostling, Mikael
    SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 966 - 969
  • [28] Low power-loss 4H-SiC Schottky rectifiers with high blocking voltage
    Itoh, A
    Kimoto, T
    Matsunami, H
    SILICON CARBIDE AND RELATED MATERIALS 1995, 1996, 142 : 689 - 692
  • [29] 1 x 16 Pt/4H-SiC Schottky Photodiode Array for Low-Level EUV and UV Spectroscopic Detection
    Hu, Jun
    Xin, Xiaobin
    Joseph, Charles L.
    Li, Xueqing
    Zhao, Jian H.
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (21-24) : 2030 - 2032
  • [30] Optimized design of 4H-SiC UMOSFET for high breakdown voltage
    Zou, Xian
    Wu, Zhiming
    Wang, Weiping
    Yin, Defu
    Li, Guangrong
    Sun, Yongqiang
    Wu, Yaping
    Li, Xu
    Kang, Junyong
    AOPC 2020: OPTICAL SENSING AND IMAGING TECHNOLOGY, 2020, 11567