Simple spatially resolved period measurement of chirped pulse compression gratings

被引:3
作者
Bienert, Florian [1 ]
Roecker, Christoph [1 ]
Graf, Thomas [1 ]
Ahmed, Marwan Abdou [1 ]
机构
[1] Univ Stuttgart, Inst Strahlwerkzeuge IFSW, Pfaffenwaldring 43, D-70569 Stuttgart, Germany
基金
欧盟地平线“2020”;
关键词
GROOVE DENSITY; ACCURATE;
D O I
10.1364/OE.489238
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present an easy-to-implement and low-cost setup for the precise measurement of the period chirp of diffraction gratings offering a resolution of 15 pm and reasonable scan speeds of 2 seconds per measurement point. The principle of the measurement is illustrated on the example of two different pulse compression gratings, one fabricated by laser interference lithography (LIL) and the other by scanning beam interference lithography (SBIL). A period chirp of 0.22 pm/mm2 at a nominal period of 610 nm was measured for the grating fabricated with LIL, whereas no chirp was observed for the grating fabricated by SBIL, which had a nominal period of 586.2 nm.
引用
收藏
页码:19392 / 19403
页数:12
相关论文
共 43 条
[21]   CHIRPED GRATINGS IN INTEGRATED-OPTICS [J].
KATZIR, A ;
LIVANOS, AC ;
SHELLAN, JB ;
YARIV, A .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1977, 13 (04) :296-304
[22]   Manufacture and development of multilayer diffraction gratings - art. no. 59911G [J].
Keck, J ;
Oliver, JB ;
Kessler, TJ ;
Huang, H ;
Barone, J ;
Hettrick, J ;
Rigatti, AL ;
Hoover, T ;
Marshall, KL ;
Schmid, AW ;
Kozlov, A ;
Kosc, TZ .
Laser-Induced Damage in Optical Materials: 2005, 2005, 5991 :G9911-G9911
[23]   High accuracy laser diffractometer: angle-scale traceability by the error separation method with a grating [J].
Korpelainen, V. ;
Iho, A. ;
Seppa, J. ;
Lassila, A. .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2009, 20 (08)
[24]   Development of a simple, compact, low-cost interference lithography system [J].
Korre, Hasan ;
Fucetola, Corey P. ;
Johnson, Jeremy A. ;
Berggren, Karl K. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (06) :C6Q20-C6Q24
[25]  
Li M., 2016, HOLOGR DIFFRACTIVE O, V10022
[26]   Technique for measuring the groove density of a diffraction grating with elimination of the eccentricity effect [J].
Lim, J ;
Rah, S .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (03) :780-782
[27]  
Liu Q., 2008, 2008 INT C OPT INSTR, V7158
[28]   Interference lithography: a powerful tool for fabricating periodic structures [J].
Lu, Cheng ;
Lipson, R. H. .
LASER & PHOTONICS REVIEWS, 2010, 4 (04) :568-580
[29]   Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control [J].
Ortlepp, Ingo ;
Stauffenberg, Jaqueline ;
Manske, Eberhard .
SENSORS, 2021, 21 (17)
[30]   Imaging laser diffractometer for traceable grating pitch calibration [J].
Pekelsky, J. R. ;
Eves, B. J. ;
Nistico, P. R. ;
Decker, J. E. .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (02) :375-383