Four-input-C-element-based multiple-node-upset-self-recoverable latch designs

As microelectronics technology has continued to progress, the multiple-node upset (MNU), caused by the single -particle and charge-sharing effects, has gradually become one of the most important factors affecting chip reliability. To enhance the reliability of these latches, a TNU completely self-recoverable (TNUCR) latch is first proposed in this paper, mainly consisting of five interlocked four-input C-elements (CEs) and inverters, which are cross-connected to form a ring. For any individual CE, due to the presence of a feedback loop, the value of its output is inverted and becomes the input to the other four CEs, which enables the latch to self-recover from all TNUs. Second, we propose an improved low-cost TNU completely self-recoverable (LCTNUCR) latch. This latch replaces the inverter with a four-input CE and uses a high-speed transmission path (HSTP), which can more rapidly self-recover from all TNU situations. It is demonstrated by experimental results that the two proposed latches are not only TNU tolerant but also TNU self-recoverable. Moreover, based on special design and the adoption of clock gating techniques, the proposed TNUCR latch has a delay-power -area product reduction of about 41.05%, while the proposed LCTNUCR latch has a DPAP reduction of about 71.30% compared to the latest representative TNU hardened latch.