Oxygen plasma-assisted ultra-low temperature sol-gel-preparation of the PZT thin films

被引:6
|
作者
Li, Han [1 ,2 ]
Hu, Yuhao [1 ,2 ]
Wei, Siyue [1 ,2 ]
Meng, Yingzhi [1 ]
Wang, Ningzhang [1 ]
Zhang, Qi [3 ,4 ]
Liu, Laijun [5 ]
Peng, Biaolin [2 ]
机构
[1] Guangxi Univ, Sch Resources Environm & Mat, Nanning 530004, Peoples R China
[2] Xidian Univ, Sch Adv Mat & Nanotechnol, Xian 710126, Peoples R China
[3] UPV EHU Sci Pk, Basque Ctr Mat Applicat & Nanostruct, Barrio Sarriena s-n, Leioa 48940, Spain
[4] Basque Fdn Sci, IKERBASQUE, Plaza Euskadi, 5, Bilbao 48009, Spain
[5] Guilin Univ Technol, Coll Mat Sci & Engn, Guilin 541004, Peoples R China
基金
中国国家自然科学基金;
关键词
PZT thin Films; Sol-gel; Oxygen plasma; Ultra-low temperature; Ferroelectric properties; CERAMICS;
D O I
10.1016/j.ceramint.2022.11.279
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
PbTi1-xZrxO3 (PZT) thin films prepared by sol-gel method have paid much attention due to the excellent per-formances in piezoelectric, dielectric, ferroelectric and electro-optical. However, the high crystallization tem-perature of the PZT thin films restricts the compatibility with modern COMS technology. In this work, PbZr0.52Ti0.48O3 (PZT) ferroelectric thin films were successfully prepared by sol-gel method at an ultra-low temperature (-450 degrees C) in an oxygen plasma-assisted environment. A large spontaneous polarization-30 mu C/ cm2 and a large dielectric breakdown-2,900 kV/cm were obtained in the sample annealed at 450 degrees C for 25 h. We believe that the oxygen plasma-assisted ultra-low temperature (OPAULT) annealing process is a promising way for the sol-gel technology applied in the modern COMS devices.
引用
收藏
页码:10864 / 10870
页数:7
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