Progress, Challenges, and Opportunities in Oxide Semiconductor Devices: A Key Building Block for Applications Ranging from Display Backplanes to 3D Integrated Semiconductor Chips

被引:148
作者
Kim, Taikyu [1 ,3 ]
Choi, Cheol Hee [1 ]
Hur, Jae Seok [1 ]
Ha, Daewon [2 ]
Kuh, Bong Jin [2 ]
Kim, Yongsung
Cho, Min Hee [2 ]
Kim, Sangwook [3 ]
Jeong, Jae Kyeong [1 ]
机构
[1] Hanyang Univ, Dept Elect Engn, Seoul 04763, South Korea
[2] Semicond R&D Ctr, Samsung Elect, Hwaseong 18848, Gyeonggi Do, South Korea
[3] Samsung Adv Inst Technol, Samsung Elect, Suwon 16678, Gyeonggi Do, South Korea
关键词
3D devices; back-end-of-line transistors; field-effect transistors; memory devices; monolithic 3D integration; oxide semiconductors; synaptic devices; THIN-FILM TRANSISTORS; ATOMIC-LAYER-DEPOSITION; FIELD-EFFECT TRANSISTORS; HIGH-PERFORMANCE; LOW-VOLTAGE; EFFECT MOBILITY; LOW-TEMPERATURE; GATE-STACK; ELECTRONIC-STRUCTURE; CARRIER TRANSPORT;
D O I
10.1002/adma.202204663
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
As Si has faced physical limits on further scaling down, novel semiconducting materials such as 2D transition metal dichalcogenides and oxide semiconductors (OSs) have gained tremendous attention to continue the ever-demanding downscaling represented by Moore's law. Among them, OS is considered to be the most promising alternative material because it has intriguing features such as modest mobility, extremely low off-current, great uniformity, and low-temperature processibility with conventional complementary-metal-oxide-semiconductor-compatible methods. In practice, OS has successfully replaced hydrogenated amorphous Si in high-end liquid crystal display devices and has now become a standard backplane electronic for organic light-emitting diode displays despite the short time since their invention in 2004. For OS to be implemented in next-generation electronics such as back-end-of-line transistor applications in monolithic 3D integration beyond the display applications, however, there is still much room for further study, such as high mobility, immune short-channel effects, low electrical contact properties, etc. This study reviews the brief history of OS and recent progress in device applications from a material science and device physics point of view. Simultaneously, remaining challenges and opportunities in OS for use in next-generation electronics are discussed.
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页数:50
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