A Chip Defect Detection System Based on Machine Vision

For chip testing, in the process of the actual chip manufacturing since most of the chip size is very small, so the artificial extremely difficult to discern defect signals, such as lack of pin, pin bending, surface defects such as scratches, lack of the shape signal, thus easy to cause the yield is not ideal, therefore in the process of actual production introduction of machine vision. Chip defect detection system based on machine vision is a kind of machine vision, chip bearing platform, automatic rotating disc, etc., on the basis of combining computer terminal to control the whole test system, in view of the chip pins, surface, shape features such as visual algorithm analysis, finally through the man-machine interface technology of motion control system and chip testing results show that the Finally, the system is made and the best detection state is debugged. It can improve the yield of products and improve the production efficiency in the actual manufacturing process.