Minimizing the Effect of Specular Reflection on Object Detection and Pose Estimation of Bin Picking Systems Using Deep Learning

被引:2
作者
Jayasinghe, Daksith [1 ]
Abeysinghe, Chandima [1 ]
Opanayaka, Ramitha [1 ]
Dinalankara, Randima [1 ]
Silva, Bhagya Nathali [1 ]
Wijesinghe, Ruchire Eranga [2 ]
Wijenayake, Udaya [1 ]
机构
[1] Univ Sri Jayewardenepura, Fac Engn, Dept Comp Engn, Nugegoda 10250, Sri Lanka
[2] Univ Sri Jayewardenepura, Fac Technol, Dept Mat & Mech Technol, Nugegoda 10250, Sri Lanka
关键词
specular reflection; bin picking; object detection; pose estimation; deep learning; IMAGE; COMPONENTS;
D O I
10.3390/machines11010091
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The rapid evolution towards industrial automation has widened the usage of industrial applications, such as robot arm manipulation and bin picking. The performance of these applications relies on object detection and pose estimation through visual data. In fact, the clarity of those data significantly influences the accuracy of object detection and pose estimation. However, a majority of visual data corresponding to metal or glossy surfaces tend to have specular reflections that reduce the accuracy. Hence, this work aims to improve the performance of industrial bin-picking tasks by reducing the effects of specular reflections. This work proposes a deep learning (DL)-based neural network model named SpecToPoseNet to improve object detection and pose estimation accuracy by intelligently removing specular reflections. The proposed work implements a synthetic data generator to train and test the SpecToPoseNet. The conceptual breakthrough of this work is its ability to remove specular reflections from scenarios with multiple objects. With the use of the proposed method, we could reduce the fail rate of object detection to 7%, which is much less compared to specular images (27%), U-Net (20%), and the basic SpecToPoseNet model (11%). Thus, it is claimable that the performance improvements gained are positive influences of the proposed DL-based contexts such as bin-picking.
引用
收藏
页数:24
相关论文
共 43 条
[1]  
Arandjelovic R, 2012, PROC CVPR IEEE, P2911, DOI 10.1109/CVPR.2012.6248018
[2]   Detection of diffuse and specular interface reflections and inter-reflections by color image segmentation [J].
Bajcsy, R ;
Lee, SW ;
Leonardis, A .
INTERNATIONAL JOURNAL OF COMPUTER VISION, 1996, 17 (03) :241-272
[3]   Color image segmentation: advances and prospects [J].
Cheng, HD ;
Jiang, XH ;
Sun, Y ;
Wang, JL .
PATTERN RECOGNITION, 2001, 34 (12) :2259-2281
[4]   Generating Images with Physics-Based Rendering for an Industrial Object Detection Task: Realism versus Domain Randomization [J].
Eversberg, Leon ;
Lambrecht, Jens .
SENSORS, 2021, 21 (23)
[5]   Specular reflection reduction with multi-flash imaging [J].
Feris, R ;
Raskar, R ;
Tan, KH ;
Turk, M .
XVII BRAZILIAN SYMPOSIUM ON COMPUTER GRAPHICS AND IMAGE PROCESSING, PROCEEDINGS, 2004, :316-321
[6]   Generative adversarial networks for specular highlight removal in endoscopic images [J].
Funke, Isabel ;
Bodenstedt, Sebastian ;
Riediger, Carina ;
Weitz, Juergen ;
Speidel, Stefanie .
MEDICAL IMAGING 2018: IMAGE-GUIDED PROCEDURES, ROBOTIC INTERVENTIONS, AND MODELING, 2018, 10576
[7]   Towards automatic visual inspection: A weakly supervised learning method for industrial applicable object detection [J].
Ge, Ce ;
Wang, Jing ;
Wang, Jingyu ;
Qi, Qi ;
Sun, Haifeng ;
Liao, Jianxin .
COMPUTERS IN INDUSTRY, 2020, 121
[8]   Fast R-CNN [J].
Girshick, Ross .
2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV), 2015, :1440-1448
[9]   Rich feature hierarchies for accurate object detection and semantic segmentation [J].
Girshick, Ross ;
Donahue, Jeff ;
Darrell, Trevor ;
Malik, Jitendra .
2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, :580-587
[10]   Deep Clustering with Convolutional Autoencoders [J].
Guo, Xifeng ;
Liu, Xinwang ;
Zhu, En ;
Yin, Jianping .
NEURAL INFORMATION PROCESSING (ICONIP 2017), PT II, 2017, 10635 :373-382