Composition and Element Distribution Mapping of γ′ and γ" Phases of Inconel 718 by High-Resolution Scanning Transmission Electron Microscopy and X-ray Energy-Dispersive Spectrometry

被引:5
作者
Buffat, Philippe A. [1 ]
Alexandrou, Ioannis [2 ]
Czyrska-Filemonowicz, Aleksandra [3 ]
机构
[1] Ecole Polytech Fed Lausanne, Ctr Interdisciplinaire Microscopie Elect, Ch Vioz 14, CH-1865 Les Diablerets, Switzerland
[2] Thermo Fisher Sci, Schakel 2, NL-5651 GH Eindhoven, Netherlands
[3] AGH Univ Sci & Technol, Fac Met Engn & Comp Sci, Ctr Electron Microscopy Mat Sci, Al A Mickiewicza 30, PL-30059 Krakow, Poland
关键词
superalloys; Inconel; interface structure; phase composition; EDXS-HRSTEM; ATOM-PROBE TOMOGRAPHY; MICROANALYSIS; PRECIPITATION; SIMULATION; CONTRAST; ALLOY; STEM;
D O I
10.3390/ma17030594
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The main strengthening mechanism for Inconel 718 (IN718), a Ni-based superalloy, is precipitation hardening by gamma ' and gamma '' particles. It is thus essential, for good alloy performance, that precipitates with the desired chemical composition have adequate size and dispersion. The distribution of the gamma ' and gamma '' phases and their chemical composition were investigated in the nickel-based Inconel 718 superalloy by taking advantage of the new capabilities of scanning transmission electron microscopy and energy-dispersive X-ray spectrometry using a windowless multiple detector, a high-brightness Schottky electron gun, and a spherical aberration corrector in the illumination probe optics. A small routine was developed to deconvolute the respective compositions of gamma ' and gamma '' nanoprecipitates embedded in the gamma matrix. Keeping the electron probe current low enough-a few hundred pA-prevented excessive irradiation damage during the acquisition of element maps and brought their spatial resolution down to the atomic column level to track their element compositions. The present results agree with and complement atomic probe tomography observations and Thermo-Calc predictions from the literature. The presence of an Al enrichment at the gamma '/gamma '' interface-which may control the gamma '' phase coarsening-is observed in the last row of Al-Nb-Ti columns along this interface. In addition, a few columns with similar composition changes are found randomly distributed in the gamma ' phase.
引用
收藏
页数:18
相关论文
共 55 条
  • [1] Simulation in elemental mapping using aberration-corrected electron microscopy
    Allen, L. J.
    [J]. ULTRAMICROSCOPY, 2017, 180 : 142 - 149
  • [2] Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy
    Allen, Leslie J.
    D'Alfonso, Adrian J.
    Freitag, Bert
    Klenov, Dmitri O.
    [J]. MRS BULLETIN, 2012, 37 (01) : 47 - 52
  • [3] [Anonymous], IMAGEJ IMAGE PROCESS
  • [4] Ayache J, 2010, SAMPLE PREPARATION HANDBOOK FOR TRANSMISSION ELECTRON MICROSCOPY: TECHNIQUES, P153, DOI 10.1007/978-1-4419-5975-1_4
  • [5] Dr. Probe: A software for high-resolution STEM image simulation
    Barthel, J.
    [J]. ULTRAMICROSCOPY, 2018, 193 : 1 - 11
  • [6] Barthel J., Probe-High-Resolution (S)TEM Image Simulation Software
  • [7] Synergy between transmission electron microscopy and powder diffraction: application to modulated structures
    Batuk, Dmitry
    Batuk, Maria
    Abakumov, Artem M.
    Hadermann, Joke
    [J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS, 2015, 71 : 127 - 143
  • [8] Buffat P., 2004, European Microscopy Society Yearbook, P78
  • [9] Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy
    Chen, Z.
    Taplin, D. J.
    Weyland, M.
    Allen, L. J.
    Findlay, S. D.
    [J]. ULTRAMICROSCOPY, 2017, 176 : 52 - 62
  • [10] Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy
    Chen, Z.
    Weyland, M.
    Sang, X.
    Xu, W.
    Dycus, J. H.
    LeBeau, J. M.
    D'Alfonso, A. J.
    Allen, L. J.
    Findlay, S. D.
    [J]. ULTRAMICROSCOPY, 2016, 168 : 7 - 16