Identification of Material Dimensionality Based on Force Constant Analysis

被引:3
作者
Bagheri, Mohammad [1 ]
Berger, Ethan [1 ]
Komsa, Hannu-Pekka [1 ]
机构
[1] Univ Oulu, Fac Informat Technol & Elect Engn, Microelect Res Unit, Oulu FIN-90014, Finland
关键词
2-DIMENSIONAL MATERIALS; WAALS; SUPERCONDUCTIVITY; EXFOLIATION; PREDICTION; STRENGTH; PROGRESS;
D O I
10.1021/acs.jpclett.3c01635
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Identification of low-dimensional structural units from the bulk atomic structure is a widely used approach for discovering new low-dimensional materials with new properties and applications. Such analysis is usually based solely on bond-length heuristics, whereas an analysis based on bond strengths would be physically more justified. Here, we study dimensionality classification based on the interatomic force constants of a structure with different approaches for selecting the bonded atoms. The implemented approaches are applied to the existing database of first-principles calculated force constants with a large variety of materials, and the results are analyzed by comparing them to those of several bond-length-based classification methods. Depending on the approach, they can either reproduce results from bond-length-based methods or provide complementary information. As an example of the latter, we managed to identify new non-van der Waals two-dimensional material candidates.
引用
收藏
页码:7840 / 7847
页数:8
相关论文
共 55 条
[1]   Toward a Rigorous Definition of a Strength of Any Interaction Between Bader's Atomic Basins [J].
Ananyev, Ivan V. ;
Karnoukhova, Valentina A. ;
Dmitrienko, Artem O. ;
Lyssenko, Konstantin A. .
JOURNAL OF PHYSICAL CHEMISTRY A, 2017, 121 (23) :4517-4522
[2]   Topology-Scaling Identification of Layered Solids and Stable Exfoliated 2D Materials [J].
Ashton, Michael ;
Paul, Joshua ;
Sinnott, Susan B. ;
Hennig, Richard G. .
PHYSICAL REVIEW LETTERS, 2017, 118 (10)
[3]  
Bagheri M., 2023, FCDIMEN
[4]   High-throughput computation of Raman spectra from first principles [J].
Bagheri, Mohammad ;
Komsa, Hannu-Pekka .
SCIENTIFIC DATA, 2023, 10 (01)
[5]   Screening 0D Materials for 2D Nanoelectronics Applications [J].
Bagheri, Mohammad ;
Komsa, Hannu-Pekka .
ADVANCED ELECTRONIC MATERIALS, 2023, 9 (01)
[6]   One-dimensional van der Waals quantum materials [J].
Balandin, Alexander A. ;
Kargar, Fariborz ;
Salguero, Tina T. ;
Lake, Roger K. .
MATERIALS TODAY, 2022, 55 :74-91
[7]   A New Group of 2D Non-van der Waals Materials with Ultra Low Exfoliation Energies [J].
Barnowsky, Tom ;
Krasheninnikov, Arkady V. ;
Friedrich, Rico .
ADVANCED ELECTRONIC MATERIALS, 2023, 9 (04)
[8]  
Berzelius J.J., 1826, Ann der Physik, V83, P261
[9]   van der Waals Bonding in Layered Compounds from Advanced Density-Functional First-Principles Calculations [J].
Bjorkman, T. ;
Gulans, A. ;
Krasheninnikov, A. V. ;
Nieminen, R. M. .
PHYSICAL REVIEW LETTERS, 2012, 108 (23)
[10]   How strong is it? The interpretation of force and compliance constants as bond strength descriptors [J].
Brandhorst, Kai ;
Grunenberg, Joerg .
CHEMICAL SOCIETY REVIEWS, 2008, 37 (08) :1558-1567