Characterization of optical waveguides in Ce3+-doped phosphate glasses formed by He+ion implantation

被引：4

作者：

Lu, Yan ^{[1
]}

Chen, Yang-Zhi ^{[1
]}

Zhang, Liao-Lin ^{[2
]}

He, Quan-Long ^{[3
,4
]}

Liu, Chun-Xiao ^{[1
]}

机构：

[1] Nanjing Univ Posts & Telecommun, Coll Elect & Opt Engn, Nanjing 210023, Peoples R China

[2] Jiangxi Univ Sci & Technol, Sch Mat Sci & Engn, Ganzhou 341000, Peoples R China

[3] China Natl Logging Corp, Logging Technol Res Inst, Xian 710077, Shaanxi, Peoples R China

[4] China Natl Petr Corp, Well Logging Key Lab, Xian 710077, Shaanxi, Peoples R China

来源：

PHYSICA SCRIPTA | 2023年 / 98卷 / 11期

基金：

中国国家自然科学基金;

关键词：

ion implantation; Ce3+-doped phosphate glass; optical waveguide; FABRICATION;

D O I：

10.1088/1402-4896/acfeb3

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this work, the Ce3+-doped phosphate glass is carried out to fabricate the planar waveguides by the 400 keV He+ ion implantation with a dose of 6.0 x 10(16) ions cm(-2). The dark-mode spectrum of the waveguide at a wavelength of 632.8 nm is obtained by the prism coupling technique. The SRIM 2013 software is used to analyze the energy deposition induced by the ion implantation and the RCM is employed to reconstruct the refractive index profile of the planar waveguide. The end-face coupling technique is applied to the measurement of the propagation mode image of the waveguide at 632.8 nm. The Ce3+-doped phosphate glass waveguide has the potential for an integrated optical device.

引用

页数：7

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