Mechanically Robust Poly(ionic liquid) Block Copolymers as Self-Assembling Gating Materials for Single-Walled Carbon-Nanotube-Based Thin-Film Transistors

被引:9
|
作者
Nosov, Daniil R. [1 ,2 ]
Ronnasi, Bahar [3 ]
Lozinskaya, Elena I. [4 ]
Ponkratov, Denis O. [4 ]
Puchot, Laura [1 ]
Grysan, Patrick [1 ]
Schmidt, Daniel F. [1 ]
Lessard, Benoit H. [3 ,5 ]
Shaplov, Alexander S. [1 ]
机构
[1] Luxembourg Inst Sci & Technol LIST, L-4362 Esch Sur Alzette, Luxembourg
[2] Univ Luxembourg, Dept Phys & Mat Sci, L-4365 Esch Sur Alzette, Luxembourg
[3] Univ Ottawa, Dept Chem & Biol Engn, Ottawa, ON K1N 6N5, Canada
[4] RAS, AN Nesmeyanov Inst Organoelement Cpds, INEOS, Moscow 119334, Russia
[5] Univ Ottawa, Sch Elect Engn & Comp Sci, Ottawa, ON K1N 6N5, Canada
来源
ACS APPLIED POLYMER MATERIALS | 2023年 / 5卷 / 04期
基金
加拿大自然科学与工程研究理事会; 俄罗斯科学基金会;
关键词
poly(ionic liquid); polyelectrolyte; ionic conductivity; block copolymer self-assembly; capacitor; thin-film transistors; IONIC LIQUID; POLY(ETHYLENE OXIDE); TRIBLOCK COPOLYMERS; ELECTROLYTES; LITHIUM; POLYMER; CONDUCTIVITY; MORPHOLOGY; CATIONS; DESIGN;
D O I
10.1021/acsapm.2c02223
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The proliferation of high-performance thin-film electronics depends on the development of highly conductive solid-state polymeric materials. We report on the synthesis and properties investigation of well-defined cationic and anionic poly(ionic liquid) AB-C type block copolymers, where the AB block was formed by random copolymerization of highly conductive anionic or cationic monomers with poly(ethylene glycol) methyl ether methacrylate, while the C block was obtained by post polymerization of 2-phenylethyl methacrylate. The resulting ionic block copolymers were found to self-assemble into a lamellar morphology, exhibiting high ionic conductivity (up to 3.6 x 10-6 S cm-1 at 25 degrees C) and sufficient electrochemical stability (up to 3.4 V vs Ag+/Ag at 25 degrees C) as well as enhanced viscoelastic (mechanical) performance (storage modulus up to 3.8 x 105 Pa). The polymers were then tested as separators in two all-solid-state electrochemical devices: parallel plate metal-insulator-metal (MIM) capacitors and thin-film transistors (TFTs). The laboratory scale truly solid-state MIM capacitors showed the start of electrical double-layer (EDL) formation at -103 Hz and high areal capacitance (up to 17.2 mu F cm-2). For solid-state TFTs, low hysteresis was observed at 10 Hz due to the completion of EDL formation and the devices were found to have low threshold voltages of -0.3 and 1.1 V for p-type and n-type operations, respectively.
引用
收藏
页码:2639 / 2653
页数:15
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