Sensitivity enhancement of the surface plasmon resonance sensor based on gallium-doped zinc oxide and silicon for cancer detection: A wavelength interrogation approach

被引:20
作者
Salah, Nasih Hma [1 ]
Pal, Amrindra [2 ]
Rasul, Hogr M. [1 ]
Uniyal, Arun [3 ]
机构
[1] Salahaddin Univ, Coll Sci, Phys Dept, Erbil, Iraq
[2] DIT Univ, Sch Engn & Technol, Dept ECE, Dehra Dun 248009, Uttarakhand, India
[3] Inst Technol Gopeshwar, Dept Elect & Commun Engg, Chamoli 246424, Uttarakhand, India
来源
MICRO AND NANOSTRUCTURES | 2024年 / 186卷
关键词
Surface plasmon resonance; Sensitivity; Silicon; Cancer detection; Wavelength interrogation; Transfer matrix method; Reflectance calculation; Attenuated total reflection;
D O I
10.1016/j.micrna.2023.207736
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Surface plasmon resonance (SPR) sensors have become an essential tool for the label-free and immediate detection of biomolecular interactions. This paper presents a unique method for increasing the sensitivity of an SPR sensor designed for cancer detection. We offer a sensor design that promises improved detection capabilities using the unique characteristics of silicon (Si) and gallium-doped zinc oxide (GZO). The method uses a wavelength interrogation technique to precisely monitor biomolecular interactions by taking advantage of the spectrum changes SPR brings. The sensor's potential for detecting early-stage cancer is shown by numerical findings that support a considerable improvement in sensitivity to 1711.7 nm/RIU for Basal cancer cells. A promising route for developing biological sensing technologies is the combination of GZO and Si in the SPR sensor, wavelength interrogation, transfer matrix method (TMM)-based reflectance computation, and the attenuated total reflection principle.
引用
收藏
页数:11
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