Advances in mobility enhancement of ITZO thin-film transistors: a review

被引:26
作者
Chen, Feilian [1 ]
Zhang, Meng [1 ]
Wan, Yunhao [2 ]
Xu, Xindi [2 ]
Wong, Man [3 ]
Kwok, Hoi-Sing [3 ]
机构
[1] Shenzhen Univ, Coll Elect & Informat Engn, Shenzhen 518060, Peoples R China
[2] Shenzhen Univ, Inst Microscale Optoelect IMO, Shenzhen 518060, Peoples R China
[3] Hong Kong Univ Sci & Technol, State Key Lab Adv Displays & Optoelect Technol, Kowloon, Clear Water Bay, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
thin-film transistor (TFT); indium-tin-zinc oxide (ITZO) TFT; mobility; active matrix (AM) displays; BIAS STABILITY; ELECTRICAL CHARACTERISTICS; OXYGEN VACANCY; PERFORMANCE; LAYER; TEMPERATURE; PASSIVATION; TFTS; RESISTANCE; DISPLAYS;
D O I
10.1088/1674-4926/44/9/091602
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Indium-tin-zinc oxide (ITZO) thin-film transistor (TFT) technology holds promise for achieving high mobility and offers significant opportunities for commercialization. This paper provides a review of progress made in improving the mobility of ITZO TFTs. This paper begins by describing the development and current status of metal-oxide TFTs, and then goes on to explain the advantages of selecting ITZO as the TFT channel layer. The evaluation criteria for TFTs are subsequently introduced, and the reasons and significance of enhancing mobility are clarified. This paper then explores the development of high-mobility ITZO TFTs from five perspectives: active layer optimization, gate dielectric optimization, electrode optimization, interface optimization, and device structure optimization. Finally, a summary and outlook of the research field are presented.
引用
收藏
页数:15
相关论文
共 91 条
[1]   Oxide-TFT technologies for next-generation AMOLED displays [J].
Arai, Toshiaki .
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2012, 20 (03) :156-161
[2]   High-Performance Thin-Film Transistors of Quaternary Indium-Zinc-Tin Oxide Films Grown by Atomic Layer Deposition [J].
Baek, In-Hwan ;
Pyeon, Jung Joon ;
Han, Seong Ho ;
Lee, Ga-Yeon ;
Choi, Byung Joon ;
Han, Jeong Hwan ;
Chung, Taek-Mo ;
Hwang, Cheol Seong ;
Kim, Seong Keun .
ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (16) :14892-14901
[3]   In-Zn-Sn-O thin film based transistor with high-k HfO2 dielectric [J].
Bak, Yang Gyu ;
Park, Ji Woon ;
Park, Ye Jin ;
Ansari, Mohd Zahid ;
NamGung, Sook ;
Cho, Bo Yeon ;
Kim, Soo-Hyun ;
Lee, Hee Young .
THIN SOLID FILMS, 2022, 753
[4]   POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS [J].
BROTHERTON, SD .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (06) :721-738
[5]   High Performance of a-IZTO TFT by Purification of the Semiconductor Oxide Precursor [J].
Bukke, Ravindra Naik ;
Mude, Narendra Naik ;
Saha, Jewel Kumer ;
Jang, Jin .
ADVANCED MATERIALS INTERFACES, 2019, 6 (13)
[6]   Effect of Hf Alloy in ZrOx Gate Insulator for Solution Processed a-IZTO Thin Film Transistors [J].
Bukke, Ravindra Naik ;
Mude, Narendra Naik ;
Lee, Jiseob ;
Avis, Christophe ;
Jang, Jin .
IEEE ELECTRON DEVICE LETTERS, 2019, 40 (01) :32-35
[7]   Remarkable Increase in Field Effect Mobility of Amorphous IZTO Thin-Film Transistors With Purified ZrOx Gate Insulator [J].
Bukke, Ravindra Naik ;
Avis, Christophe ;
Naik, Mude Narendra ;
Jang, Jin .
IEEE ELECTRON DEVICE LETTERS, 2018, 39 (03) :371-374
[8]   Solution-Processed Amorphous In-Zn-Sn Oxide Thin-Film Transistor Performance Improvement by Solution-Processed Y2O3 Passivation [J].
Bukke, Ravindra Naik ;
Avis, Christophe ;
Jang, Jin .
IEEE ELECTRON DEVICE LETTERS, 2016, 37 (04) :433-436
[9]   Performance enhancement of solution-processed InZnO thin-film transistors by Al doping and surface passivation [J].
Cai, Wensi ;
Li, Haiyun ;
Li, Mengchao ;
Zang, Zhigang .
JOURNAL OF SEMICONDUCTORS, 2022, 43 (03)
[10]   Enhanced electrical properties of oxide semiconductor thin-film transistors with high conductivity thin layer insertion for the channel region [J].
Cam Phu Thi Nguyen ;
Raja, Jayapal ;
Kim, Sunbo ;
Jang, Kyungsoo ;
Le, Anh Huy Tuan ;
Lee, Youn-Jung ;
Yi, Junsin .
APPLIED SURFACE SCIENCE, 2017, 396 :1472-1477