Effect of low temperature annealing on microstructure and properties of copper foil

被引:7
作者
Wang, Li-ping [1 ]
Bai, Zhong-bo [1 ]
Sun, Wan-chang [1 ]
Du, Liang-liang [1 ]
Peng, Xiao-lin [1 ]
Xiao, Yan [1 ]
Zhang, Jie [1 ]
Jia, Ya-peng [1 ]
Du, Shuang-ming [1 ]
Cai, Hui [1 ]
Liu, Er-yong [1 ]
机构
[1] Xian Univ Sci & Technol, Coll Mat Sci & Engn, Xian 710054, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
Copper foil; Low temperature annealing; Microstructure; Recrystallization; Residual stress; ELECTROPLATED CU; EVOLUTION; RECRYSTALLIZATION; BEHAVIOR;
D O I
10.1016/j.mtcomm.2023.106617
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electrodeposited copper foil has a non-equilibrium microstructure, and self-annealing takes place at room temperature. In this paper, the evolution of morphology, texture, and microstructure of copper foil during lowtemperature annealing was analyzed. Then the microstructure and properties of copper foil deposited by a thickness of 6 & mu;m electrodeposition were systematically studied. The annealing twin evolution behavior of ultrathin lithium copper foil during annealing treatment is revealed. The production of twins and recrystallization of copper foil during low-temperature annealing is shown to be driven by the non-equilibrium structure and internal tension of the electrodeposited copper foil. The continual decrease in vacancy concentration is caused by an increase in annealing time. The conductivity of the copper foil is increased by 106.95 % percent by the twinning and the vacancy. The twin effect and altered grain size after annealing can reduce tensile strength by 11.55 % and increase elongation by almost 1.15 times.
引用
收藏
页数:9
相关论文
共 27 条
[1]   Recrystallization of cold rolled oxide dispersion strengthened copper during room temperature annealing [J].
Aghamiri, S. M. S. ;
Ukai, S. ;
Oono, N. ;
Kasada, R. ;
Noto, H. ;
Hishinuma, Y. ;
Muroga, T. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 798 :187-193
[2]   Laminated steel/aluminum composites: Improvement of mechanical properties by annealing treatment [J].
Amanollahi, Alireza ;
Ebrahimzadeh, Iman ;
Raeissi, Mehdi ;
Saeidi, Navid .
MATERIALS TODAY COMMUNICATIONS, 2021, 29
[3]   Evolution of annealing texture in cryo-rolled copper [J].
Anand, G. ;
Barai, K. ;
Madhavan, R. ;
Chattopadhyay, P. P. .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2015, 638 :114-120
[4]   Depth-dependent self-annealing behavior of electroplated Cu [J].
Chen, Chang-Chih ;
Yang, Cheng-Hsien ;
Wu, Ying-Syuan ;
Ho, Cheng-En .
SURFACE & COATINGS TECHNOLOGY, 2017, 320 :489-496
[5]   Effect of Electroplating Current Density on Tensile Properties of Nanotwinned Copper Foils [J].
Fang, Chuan-Yu ;
Dinh-Phut Tran ;
Liu, Hung-Che ;
Ong, Jia-Juen ;
Lin, Yi-Quan ;
Hsu, Wei-You ;
Chen, Chih .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2022, 169 (04)
[6]   Softened Microstructure and Properties of 12 μm Thick Rolled Copper Foil [J].
Feng, Rui ;
Zhao, Weichao ;
Sun, Yumei ;
Wang, Xiaowen ;
Gong, Benkui ;
Chang, Baoping ;
Feng, Tianjie .
MATERIALS, 2022, 15 (06)
[7]   Experimental and Theoretical Study on Self-Annealing Behavior of Copper Film Electroplated with 2-Mercaptopyridine and 2-Aminobenzothiazole as Additives [J].
Feng, Xue ;
Yu, Ning ;
Hang, Tao ;
Zhang, Yinhe ;
Li, Ming .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2016, 163 (02) :D57-D62
[8]   Microstructural evolution of martensite during deformation in Zr50Cu50 shape memory alloy [J].
Gao, Weihong ;
Yi, Xiaoyang ;
Sun, Bin ;
Meng, Xianglong ;
Cai, Wei ;
Zhao, Liancheng .
ACTA MATERIALIA, 2017, 132 :405-415
[9]   Cu to Cu direct bonding at low temperature with high density defect in electrodeposited Cu [J].
Han, Haneul ;
Lee, Chaerin ;
Kim, Youjung ;
Lee, Jinhyun ;
Kim, Rosa ;
Kim, Jongryoul ;
Yoo, Bongyoung .
APPLIED SURFACE SCIENCE, 2021, 550
[10]   Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing [J].
Huang, Rui ;
Robl, Werner ;
Ceric, Hajdin ;
Detzel, Thomas ;
Dehm, Gerhard .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2010, 10 (01) :47-54