Transferable Deep Metric Learning for Clustering

被引:1
作者
Chehboune, Mohamed Alami [1 ,2 ]
Kaddah, Rim [2 ]
Read, Jesse [1 ]
机构
[1] Ecole Polytech, Dept Comp Sci, Palaiseau, France
[2] IRT SystemX, Palaiseau, France
来源
ADVANCES IN INTELLIGENT DATA ANALYSIS XXI, IDA 2023 | 2023年 / 13876卷
关键词
Clustering; Transfer Learning; Metric Learning;
D O I
10.1007/978-3-031-30047-9_2
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Clustering in high dimension spaces is a difficult task; the usual distance metrics may no longer be appropriate under the curse of dimensionality. Indeed, the choice of the metric is crucial, and it is highly dependent on the dataset characteristics. However a single metric could be used to correctly perform clustering on multiple datasets of different domains. We propose to do so, providing a framework for learning a transferable metric. We show that we can learn a metric on a labelled dataset, then apply it to cluster a different dataset, using an embedding space that characterises a desired clustering in the generic sense. We learn and test such metrics on several datasets of variable complexity (synthetic, MNIST, SVHN, omniglot) and achieve results competitive with the state-of-the-art while using only a small number of labelled training datasets and shallow networks.
引用
收藏
页码:15 / 28
页数:14
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