Evaluation by scanning electron and atomic force microscopy to analyze the abrasive behavior of composites with silicon carbide

The cement mass is the part of the cementitious composite that has low resistance to friction and its mechanical and microstructural properties are decisive for the durability of the material. Microscopy techniques are com-monly used to elucidate these mechanical, physical and chemical behaviors of cementitious compounds. The objective of this work was to elucidate the importance of microscopy techniques for the direct evaluation of the abrasive behavior of cement pastes with silicon carbide (SiC) microparticles. The methodology of the work consists of the manufacture of Exceptions of reference cementitious masses and with 10% SiC addition, analysis of the compressive and abrasive mechanical properties, in addition to Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) tests. The results that the intensification of the mechanical properties with the addition of SiC microparticles can be related to the external micrographs in the SEM, through the accentuated filling of the pores, and through the attenuated surface roughness identified in the AFM. It was concluded that the roughness and porosity results, acquired by the SEM and AFM techniques, can provide relevant information for the analysis of the durability of cementitious materials.