High spectral selectivity metal-semiconductor-metal photodetector

被引:1
作者
Averin, S., V [1 ]
Kotov, V. M. [1 ]
机构
[1] Russian Acad Sci, Kotelnikov Inst Radioengn & Elect, Fryazino Branch, Sq Academician Vvedenski 1, Fryazino 141190, Russia
基金
英国科研创新办公室;
关键词
Metal-semiconductor-metal (MSM) diode; Photodetectors; Heterostructure; Dark current; Spectral response; PHOTORESPONSE; GROWTH;
D O I
10.1007/s11082-022-04085-w
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The results of experimental study of the metal-semiconductor-metal (MSM) photodiode based on ZnCdSe/ZnSSe/GaAs heterobarrier structure are presented. MSM-diode with 2.8 mu m Ni-Au interdigitated Schottky barrier contacts, gaps between them of 3 mu m, and total detector area of 100 x 100 mu m(2) have been fabricated and investigated. At a wavelength of 460 nm MSM-diode provides a high spectral selectivity with FWHM of spectral response 4.3 nm, high current sensitivity of 2.27 A/W and low dark current of 200 pA at 30 V bias. The spectral response of the MSM-detector was characterized under various bias conditions. A reduced Schottky barrier height model was adopted to explain the gain mechanism of the MSM-detector under illumination.
引用
收藏
页数:10
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