Fault-Tolerant Neural Network Accelerators With Selective TMR

被引：10

作者：

Bertoa, Timoteo Garcia ^{[1
,2
]}

Gambardella, Giulio ^{[1
]}

Fraser, Nicholas J. ^{[1
]}

Blott, Michaela ^{[1
]}

McAllister, John ^{[2
]}

机构：

[1] Xilinx Res Labs, Dublin, Ireland

[2] Queens Univ Belfast, Belfast BT7 1NN, North Ireland

来源：

IEEE DESIGN & TEST | 2023年 / 40卷 / 02期

关键词：

Hardware; Artificial neural networks; Fault tolerant systems; Reliability; Training; Redundancy; Fats; neural networks; safety; redundancy; automotive; FPGA; binary neural networks; FINN; RELIABILITY; IMPACT;

D O I：

10.1109/MDAT.2022.3174181

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Editor's notes: This article presents a tool that analyzes sensitive computations in the neural network and triplicates them to increase the functional safety of the neural network accelerator. - Fei Su, Intel Corporation © 2013 IEEE.

引用

页码：67 / 74

页数：8

共 13 条

[1]

Brosser F, 2014, PROCEEDINGS OF THE 2014 INTERNATIONAL CONFERENCE ON FIELD-PROGRAMMABLE TECHNOLOGY (FPT), P296, DOI 10.1109/FPT.2014.7082803

[2]

GAMBARDELLA G, 2019, P IEEE INT S DEF FAU, P1, DOI DOI 10.1109/DFT.2019.8875314

[3]

Hubara I, 2016, ADV NEUR IN, V29

[4]

Khoshavi N., 2020, P 57 ACM IEEE DES AU, P1

[5]

Krizhevsky A., 2009, CIFAR-100 Dataset, P5

[6] How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs [J].

Libano, F. ;

Rech, P. ;

Neuman, B. ;

Leavitt, J. ;

Wirthlin, M. ;

Brunhaver, J. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 68 (05) :865-872

[7] Selective Hardening for Neural Networks in FPGAs [J].

Libano, F. ;

Wilson, B. ;

Anderson, J. ;

Wirthlin, M. J. ;

Cazzaniga, C. ;

Frost, C. ;

Rech, P. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 66 (01) :216-222

[8]

Spyrou T, 2021, PROCEEDINGS OF THE 2021 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2021), P743, DOI 10.23919/DATE51398.2021.9474081

[9] FINN: A Framework for Fast, Scalable Binarized Neural Network Inference [J].

Umuroglu, Yaman ;

Fraser, Nicholas J. ;

Gambardella, Giulio ;

Blott, Michaela ;

Leong, Philip ;

Jahre, Magnus ;

Vissers, Kees .

FPGA'17: PROCEEDINGS OF THE 2017 ACM/SIGDA INTERNATIONAL SYMPOSIUM ON FIELD-PROGRAMMABLE GATE ARRAYS, 2017, :65-74

[10] Impact of Single-Event Upsets on Convolutional Neural Networks in Xilinx Zynq FPGAs [J].

Wang, H. -B. ;

Wang, Y. -S. ;

Xiao, J. -H. ;

Wang, S. -L. ;

Liang, T. -J. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 68 (04) :394-401

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